Patents by Inventor Zhiwei Shan

Zhiwei Shan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Micro/nano-mechanical test system employing tensile test holder with push-to-pull transformer
    Patent number: 8434370
    Abstract: A micromachined or microelectromechanical system (MEMS) based push-to-pull mechanical transformer for tensile testing of micro-to-nanometer scale material samples including a first structure and a second structure. The second structure is coupled to the first structure by at least one flexible element that enables the second structure to be moveable relative to the first structure, wherein the second structure is disposed relative to the first structure so as to form a pulling gap between the first and second structures such that when an external pushing force is applied to and pushes the second structure in a tensile extension direction a width of the pulling gap increases so as to apply a tensile force to a test sample mounted across the pulling gap between a first sample mounting area on the first structure and a second sample mounting area on the second structure.
    Type: Grant
    Filed: October 7, 2009
    Date of Patent: May 7, 2013
    Assignee: Hysitron Incorporated
    Inventors: Yunje Oh, Edward Cyrankowski, Zhiwei Shan, Syed Amanula Syed Asif
  • MICRO/NANO-MECHANICAL TEST SYSTEM EMPLOYING TENSILE TEST HOLDER WITH PUSH-TO-PULL TRANSFORMER
    Publication number: 20100095780
    Abstract: A micromachined or microelectromechanical system (MEMS) based push-to-pull mechanical transformer for tensile testing of micro-to-nanometer scale material samples including a first structure and a second structure. The second structure is coupled to the first structure by at least one flexible element that enables the second structure to be moveable relative to the first structure, wherein the second structure is disposed relative to the first structure so as to form a pulling gap between the first and second structures such that when an external pushing force is applied to and pushes the second structure in a tensile extension direction a width of the pulling gap increases so as to apply a tensile force to a test sample mounted across the pulling gap between a first sample mounting area on the first structure and a second sample mounting area on the second structure.
    Type: Application
    Filed: October 7, 2009
    Publication date: April 22, 2010
    Applicant: HYSITRON INCORPORATED
    Inventors: Yunje Oh, Edward Cyrankowski, Zhiwei Shan, Syed Amanula Syed Asif