Abstract: A method of analyzing an atomic force microscope image includes receiving data related to an atomic force microscope image, where the data includes at least a first channel of data and a second channel of data relating to a first and second image data type. The method also includes identifying at least a first location of high contrast within the image using the first image data type using edge detection and identifying a first artifact within the image based on the identified first location of high contrast. The method also includes accessing the second image data type corresponding to the identified first location of the first artifact and determining a type of the first artifact by comparing the first image data type with the second image data type relating to the identified location of the first artifact.

Abstract: A method of analyzing an atomic force microscope image includes receiving data related to an atomic force microscope image, where the data includes at least a first channel of data and a second channel of data relating to a first and second image data type. The method also includes identifying at least a first location of high contrast within the image using the first image data type using edge detection and identifying a first artifact within the image based on the identified first location of high contrast. The method also includes accessing the second image data type corresponding to the identified first location of the first artifact and determining a type of the first artifact by comparing the first image data type with the second image data type relating to the identified location of the first artifact.

Abstract: Various defects in an electronic assembly can be intelligently identified with a system having at least a server connected to a first capture module and a second capture module. The first capture module may be positioned proximal a first manufacturing line while the second capture module is positioned proximal a second manufacturing line. Images can be collected of first and second electronic assemblies by respective first and second capture modules prior to the images being sent to a classification module of the server where at least one defect is automatically detected in each of the first and second electronic assemblies concurrently with the classification module.

Abstract: A brush used to contact with a commutator, includes a brush body which includes two opposite axial end faces and a protruding portion projecting from the brush body toward the commutator. The protruding portion includes a first surface, a second surface and at least two teeth. The first surface and the second surface are respectively adjacent to the two axial end faces. Angles formed between the first surface and the second surface and corresponding adjacent axial end faces are obtuse. The teeth is located between the first surface and the second surface, and extends generally along a circumferential direction of the commutator. The ratio of a total width of the at least two teeth in an axial direction of the brush to an axial height of the brush body is in the range of 0.25-0.75. An electric motor including the brush is also provided.

Abstract: Embodiments of the specification provide a skill generating method, apparatus, and electronic device, wherein the skill generating method comprises: generating, according to a demand creating instruction and demand content data, a task corresponding to distribution target information; creating a material library according to a response instruction that responds to the task corresponding to the distribution target information; and determining a training material from the material library according to a skill training instruction to generate a skill according to the training material. Embodiments of the specification can improve the skill development efficiency.

Abstract: A rotor of an electric motor includes a rotating shaft, a rotor core and a commutator fixed to the rotating shaft, and a first sleeve, a second sleeve and a third sleeve arranged around the rotating shaft. The first sleeve is located on a side of the rotor core away from the commutator and abuts against the rotor core, the second sleeve is located between the rotor core and the commutator, and the third sleeve is located on a side of the commutator away from the rotor core.

Abstract: A method of analyzing an atomic force microscope image includes receiving data related to an atomic force microscope image, where the data includes at least a first channel of data and a second channel of data relating to a first and second image data type. The method also includes identifying at least a first location of high contrast within the image using the first image data type using edge detection and identifying a first artifact within the image based on the identified first location of high contrast. The method also includes accessing the second image data type corresponding to the identified first location of the first artifact and determining a type of the first artifact by comparing the first image data type with the second image data type relating to the identified location of the first artifact.

Abstract: A method includes receiving an image of a surface of a slider bar from an interferometer, where the slider bar includes at least two sliders, and where the image includes image data according to at least two image data channels for a slider bar surface and the at least two sliders. The method also includes generating a slider bar map of the surface of the slider bar based upon the image data of the image, where the slider bar map includes at least two data channels and ascertaining a plurality of individual slider surface maps based on a number of sliders included on the slider bar, where the ascertaining is also based upon the slider bar map having the at least two data channels. The method also includes segmenting the slider bar map according to the plurality of individual slider surface maps.

Abstract: A brush used to contact with a commutator, includes a brush body which includes two opposite axial end faces and a protruding portion projecting from the brush body toward the commutator. The protruding portion includes a first surface, a second surface and at least two teeth. The first surface and the second surface are respectively adjacent to the two axial end faces. Angles formed between the first surface and the second surface and corresponding adjacent axial end faces are obtuse. The teeth is located between the first surface and the second surface, and extends generally along a circumferential direction of the commutator. The ratio of a total width of the at least two teeth in an axial direction of the brush to an axial height of the brush body is in the range of 0.25-0.75. An electric motor including the brush is also provided.

Abstract: The present invention relates to methods for synthesizing compounds of formula I or pharmaceutically acceptable salts thereof: I wherein each of X, Alk1, Alk2, and W are as defined and described herein.

Abstract: The present invention relates to methods for synthesizing compounds of formula I or pharmaceutically acceptable salts thereof: I wherein each of X, Alk1, Alk2, and W are as defined and described herein.

Abstract: Methods for enhancing the quality of an electronic image, including automated methods for contrast enhancement and image noise reduction. In many embodiments the method provides for grouping the histogram components of a low-contrast image into the proper number of bins according to a criterion, then redistributing these bins uniformly over the grayscale, and finally ungrouping the previously grouped gray-levels. The technique is named gray-level grouping (GLG). An extension of GLG called Selective Gray-Level Grouping (SGLG), and various variations thereof are also provided. SGLG selectively groups and ungroups histogram components to achieve specific application purposes, such as eliminating background noise, enhancing a specific segment of the histogram, and so on. GLG techniques may be applied to both monochromatic grayscale images and to color images.