Patents by Inventor Zhongli Ruan

Zhongli Ruan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9537037
    Abstract: A wet etching method for an N-type bifacial cell including: (1) providing an N-type silicon wafer, proceeding with surface structuralization on the N-type silicon wafer, and producing a PN junction on a surface of the N-type silicon wafer by using a boron diffusion technique; (2) proceeding with a first mixed acid washing, etching the PN junction on an edge and a back surface of the N-type silicon wafer; (3) proceeding with a first pure water washing and a first alkaline washing, removing residual acid solution from the surface of the N-type silicon wafer; (4) proceeding with a second pure water washing and a second mixed acid washing, removing residual impurities from the surface of the N-type silicon wafer; (5) proceeding with a third pure water washing and air drying; and (6) after air drying, completing etching on the N-type bifacial cell.
    Type: Grant
    Filed: May 14, 2015
    Date of Patent: January 3, 2017
    Assignee: Shanghai Shenzhou New Energy Development Co., Ltd.
    Inventors: Fei Zheng, Zhongwei Zhang, Lei Shi, Zhongli Ruan, Chen Zhao, Yuxue Zhao
  • Publication number: 20160351741
    Abstract: A high-efficiency N-type bifacial solar cell including: an N-type cell base including a structuralized surface; a P-type doped region formed on a front surface of the N-type cell base; a polished passivation layer formed on a back surface of the N-type cell base by etching; an N+ passivation layer formed by doping phosphorus into a top portion of the polished passivation layer adjacent to the N-type cell base; a first silicon dioxide layer formed on the P-type doped region and a second silicon dioxide layer disposed on the N+ passivation layer; a first silicon nitride antireflection layer formed on the first silicon dioxide layer and a second silicon nitride antireflection layer formed on the second silicon dioxide layer; and a first metal electrode formed on the front surface of the N-type cell base and a second metal electrode formed on the back surface of the N-type cell base.
    Type: Application
    Filed: May 14, 2015
    Publication date: December 1, 2016
    Inventors: Fei Zheng, Zhongwei Zhang, Lei Shi, Zhongli Ruan, Zhihua Tao, Yuxue Zhao
  • Publication number: 20160329451
    Abstract: A wet etching method for an N-type bifacial cell including: (1) providing an N-type silicon wafer, proceeding with surface structuralization on the N-type silicon wafer, and producing a PN junction on a surface of the N-type silicon wafer by using a boron diffusion technique; (2) proceeding with a first mixed acid washing, etching the PN junction on an edge and a back surface of the N-type silicon wafer; (3) proceeding with a first pure water washing and a first alkaline washing, removing residual acid solution from the surface of the N-type silicon wafer; (4) proceeding with a second pure water washing and a second mixed acid washing, removing residual impurities from the surface of the N-type silicon wafer; (5) proceeding with a third pure water washing and air drying; and (6) after air drying, completing etching on the N-type bifacial cell.
    Type: Application
    Filed: May 14, 2015
    Publication date: November 10, 2016
    Inventors: Fei Zheng, Zhongwei Zhang, Lei Shi, Zhongli Ruan, Chen Zhao, Yuxue Zhao