Abstract: The present invention provides a knife head assembly of a novel medical electrotome and a novel medical electrotome. The knife head assembly comprises a snare ring and a cutting knife, the cutting knife comprises a knife handle fixedly connected to a distal end of the snare ring and a knife head fixedly connected to a distal end of the knife handle; the surface of the knife handle is provided with two grooves that are arranged symmetrically and extend in a length direction of the knife handle, the knife handle is further provided with a through-hole penetrating through the knife handle, the two ends of the through-hole are in communication with the two grooves respectively, the distal end of the snare ring is inserted through the through-hole, and the parts of the snare ring on the two sides of the through-hole are limited in the grooves, thus the distal end of the snare ring is embedded and fixed in the knife handle.

Abstract: Aspects of enhanced recovery mechanisms are described. A predetermined operating parameter for a power rail is set at the outset of system start. Afterwards, a processor is released to start with a power management circuit. In turn, the power management circuit receives a default operating parameter for the power rail from the processor, and stores the default operating parameter. The power management circuit also receives a runtime operating parameter for the power rail from the processor and modifies the operating parameter for the power rail according to the runtime operating parameter. If an error condition in the processor is encountered, the power management circuit may modify the operating parameter for the power rail according to the default operating parameter in response to a reset control signal from the processor. Use of the default operating parameter for the power rail may assist the processor to recover from the error condition.

Abstract: Aspects of enhanced recovery mechanisms are described. A predetermined operating parameter for a power rail is set at the outset of system start. Afterwards, a processor is released to start with a power management circuit. In turn, the power management circuit receives a default operating parameter for the power rail from the processor, and stores the default operating parameter. The power management circuit also receives a runtime operating parameter for the power rail from the processor and modifies the operating parameter for the power rail according to the runtime operating parameter. If an error condition in the processor is encountered, the power management circuit may modify the operating parameter for the power rail according to the default operating parameter in response to a reset control signal from the processor. Use of the default operating parameter for the power rail may assist the processor to recover from the error condition.

Abstract: An apparatus and method are disclosed for providing test mode contact pad reconfigurations that expose individual internal functional modules or block groups in an integrated circuit for testing and for monitoring. A plurality of switches between each functional module switches between passing internal signals among the blocks and passing in/out signals external to the block when one or more contact pads are strapped to input a pre-determined value. Another set of switches between the functional modules and input/output contact pads switch between functional inputs to and from the functional modules and monitored signals or input/output test signals according to the selected mode of operation.

Abstract: An apparatus and method are disclosed to combine pad functionality in an integrated circuit. A power, ground, or signal pad is connected to a power, ground, or signal source, respectively. The power, ground, or signal pad is additionally connected to an additional signal source, such as automatic test equipment in a testing environment. By temporarily disconnecting either the power, ground, or signal source, from the functional block within the integrated circuit to which the source is delivered, the same pad may pass in another signal to other portions of the integrated circuit. In the alternative, the same pad may pass in another signal to other portions of the integrated circuit without disconnecting the original signal by coupling the additional signal over the original signal. Further, combining pad functionality enables reuse of an input pad as an output pad for signals originating from within the integrated circuit.

Abstract: An apparatus and method are disclosed for providing test mode contact pad reconfigurations that expose individual internal functional modules or block groups in an integrated circuit for testing and for monitoring. A plurality of switches between each functional module switches between passing internal signals among the blocks and passing in/out signals external to the block when one or more contact pads are strapped to input a pre-determined value. Another set of switches between the functional modules and input/output contact pads switch between functional inputs to and from the functional modules and monitored signals or input/output test signals according to the selected mode of operation.

Abstract: A reconfigurable processor is provided. The reconfigurable processor includes a plurality of functional blocks configured to perform corresponding operations. The reconfigurable processor also includes one or more data inputs coupled to the plurality of functional blocks to provide one or more operands to the plurality of functional blocks, and one or more data outputs to provide at least one result outputted from the plurality of functional blocks.