Abstract: An ion beam cutting calibration system includes a sample cutting table, a coarse calibration device, a microscopic observation device, and a flip table. The flip table includes a flip plate, which is configured to drive the sample cutting table to swing in a vertical plane. The swing axis of the flip plate is collinear with the side edge of the top surface of the ion beam shielding plate close to the sample. Through the coordinated operation of the flip table, the microscopic observation device, the sample cutting table, and the coarse calibration device, the ion beam cutting calibration system avoids the problem that when the position relationship between the sample and the shielding plate is observed from multiple angles during calibration loading, the sample and the shielding plate are likely to be moved out of the field of vision of the microscope and out of focus.

Abstract: A 3D imaging system and method for a nanostructure is provided. The 3D imaging system includes a master control center, a vacuum chamber, an electron gun, an imaging signal detector, a broad ion beam source device, and a laser rangefinder component. A sample loading device is arranged inside the vacuum chamber. A radial source of the broad ion beam source device is arranged in parallel with an etched surface of a sample. The laser rangefinder component includes a first laser rangefinder configured to measure a distance from a top surface of an ion beam shielding plate and a second laser rangefinder configured to measure a distance from a non-etched area of the sample, the first laser rangefinder and the second laser rangefinder are arranged side by side, and a laser traveling direction is perpendicular to a traveling direction of the broad ion beam source device.

Abstract: An intelligent system and method for preparing cryo-electron microscopy samples is provided. The system includes a control center, an ultra-low temperature liquid tank, a sample holding mechanism configured to limit a position of a to-be-processed sample, a sample processing mechanism configured to cut or polish the sample, a position adjustment mechanism, and a sample transfer mechanism configured to transfer a processed sample. In a working process, the control center controls the ultra-low temperature liquid tank to provide a preset temperature environment based on a target sample type, activates the position adjustment mechanism based on position information of the sample holding mechanism in the first chamber to drive the sample processing mechanism to perform processing according to a preset processing route, and activates, based on information about the processed sample to be transferred into the second chamber, the sample transfer mechanism to transfer the processed sample in a preset environment.

Abstract: The present disclosure belongs to the field of petroleum exploration and development and, in particular, relates to a system and a method for analyzing while-drilling rock fragments in oil and gas field. The system includes a sample preparation mold and a sample scanning apparatus; the mold is configured to quickly batch prepare fragments into scanning ready samples; the apparatus is portable and configured for batch scanning and analyzing the samples, and having the capabilities of anti-vibration, temperature control, dust prevention, and adaptability to a harsh well site environment; the method includes a scanning step where surface images, elements and mineral types of rock can be rapidly quantitatively analyzed, and lithologies thereof can be identified; the method also includes the analysis step in which rock's elastic parameters and target zone of the vertical well are determined, and geosteering and design of staged fracturing of horizontal well can be provided.

Abstract: The present disclosure belongs to the field of petroleum exploration and development and, in particular, relates to a system and a method for analyzing while-drilling rock fragments in oil and gas field. The system includes a sample preparation mold and a sample scanning apparatus; the mold is configured to quickly batch prepare fragments into scanning ready samples; the apparatus is portable and configured for batch scanning and analyzing the samples, and having the capabilities of anti-vibration, temperature control, dust prevention, and adaptability to a harsh well site environment; the method includes a scanning step where surface images, elements and mineral types of rock can be rapidly quantitatively analyzed, and lithologies thereof can be identified; the method also includes the analysis step in which rock's elastic parameters and target zone of the vertical well are determined, and geosteering and design of staged fracturing of horizontal well can be provided.