Abstract: The present invention provides a pixel arrangement structure, a vapor deposition mask and an irregular-shaped display screen. The pixel arrangement structure is used for irregular-shaped display of an irregular-shaped display screen, the pixel arrangement structure is provided with several rows and/or several columns of pixel display units, wherein neighboring rows and/or neighboring columns of the pixel display units are arranged in parallel within an irregular-shaped display region (105). By arranging the pixel display units within the irregular-shaped display region (105) in such a way that the neighboring rows and/or neighboring columns of the pixel display units are parallel rows or columns, a confusion phenomenon at the interface between an irregular-shaped display region (105) and a non-display region (107) on an edge of the irregular-shaped display region (105) can be eliminated.

Abstract: The present invention provides a pixel arrangement structure, a vapor deposition mask and an irregular-shaped display screen. The pixel arrangement structure is used for irregular-shaped display of an irregular-shaped display screen, the pixel arrangement structure is provided with several rows and/or several columns of pixel display units, wherein neighboring rows and/or neighboring columns of the pixel display units are arranged in parallel within an irregular-shaped display region (105). By arranging the pixel display units within the irregular-shaped display region (105) in such a way that the neighboring rows and/or neighboring columns of the pixel display units are parallel rows or columns, a confusion phenomenon at the interface between an irregular-shaped display region (105) and a non-display region (107) on an edge of the irregular-shaped display region (105) can be eliminated.

Abstract: This invention relates to a system and a method for measuring strain of a specimen on a strain measurement system having an image capturing device, a spatial light modulator, a first light source, a second light source and a beam switching controller. The system receives parameters from an input from a user and generates a lenslet pattern to be transmitted to the spatial light modulator. The system transmits a frequency and switching sequence to the beam switching controller to alternate the first and second light sources and activate the image capturing device to capture images. The system receives a first image captured by the image capturing device caused by a beam of the first light source and a second image captured by the image capturing device caused by a beam of the second light source. Based on the first and second images received, the system optimizes the image capturing device.

Abstract: This invention relates to a system and a method for measuring testing strain resistance of a specimen on a strain measurement system having an image capturing device, a spatial light modulator, a first light source, a second light source and a beam switching controller. The system receives parameters from an input from a user and generates a lenslet pattern to be transmitted to the spatial light modulator. The system then transmits a frequency and switching sequence to the beam switching controller to alternate the first and second light sources and activate the image capturing device to capture image. Subsequently, the system receives a U image captured by the image capturing device caused by a beam of the first light source and a V image captured by the image capturing device caused by a beam of the second light source. Based on the U and V images received, the system optimises the image capturing device and subsequently displays the V and U images to a display.