Patents by Inventor Zhu NIU

Zhu NIU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11921499
    Abstract: The present disclosure describes multi-parameter dynamic sampling methods and systems. An example method includes: configuring two sampling rates for each parameter in a set of sampling parameters; selecting one of the sampling rates for each parameters to sample it; calculating a load for each parameter at the selected sampling rate, sorting the parameters according to the loads, and determining high-loaded parameters according to a sorting result; and determining whether each parameter has data loss, and if at least one of the sampling parameters has data loss, performing down-sampling on the high-loaded sampling parameters within a range of the configured at least two sampling rates.
    Type: Grant
    Filed: July 21, 2020
    Date of Patent: March 5, 2024
    Assignee: SIEMENS AKTIENGESELLSCHAFT
    Inventors: Zhu Niu, Bo Wen, Shun Jie Fan
  • Publication number: 20230273611
    Abstract: The present disclosure describes multi-parameter dynamic sampling methods and systems. An example method includes: configuring two sampling rates for each parameter in a set of sampling parameters; selecting one of the sampling rates for each parameters to sample it; calculating a load for each parameter at the selected sampling rate, sorting the parameters according to the loads, and determining high-loaded parameters according to a sorting result; and determining whether each parameter has data loss, and if at least one of the sampling parameters has data loss, performing down-sampling on the high-loaded sampling parameters within a range of the configured at least two sampling rates.
    Type: Application
    Filed: July 21, 2020
    Publication date: August 31, 2023
    Applicant: Siemens Aktiengesellschaft
    Inventors: Zhu Niu, Bo Wen, Shun Jie Fan
  • Patent number: 11711427
    Abstract: Provided are a data acquisition system and method. The system includes: data acquisition units, to acquire a plurality of pieces of data related to a target object within a data acquisition period; and a controller, communicatively connected to the data acquisition units, to set, according to an ith data acquisition period, a sampling interval time of the ith piece of data, and to set a polling interval time according to a minimum data acquisition period of the data acquisition units. Upon the controller starting to perform polling on the data acquisition units through n_1 polling interval times until a condition is satisfied for the first time, the controller performs first polling, for the ith piece of data, on a data acquisition unit of the data acquisition units for acquiring the ith piece of data.
    Type: Grant
    Filed: April 26, 2019
    Date of Patent: July 25, 2023
    Assignee: SIEMENS AKTIENGESELLSCHAFT
    Inventors: Wen Bin Cao, Zhu Niu, Shun Jie Fan
  • Patent number: 11573542
    Abstract: The present disclosure provides a method and an apparatus for adjusting a process control prediction model, and a process controller. In an embodiment, the method includes: determining, based on controlled variable data in process control data obtained through real-time monitoring, whether a prediction performance of the process control prediction model is lower than a reference performance; and when the prediction performance is determined to be lower than the reference performance, using manipulated variable data in the process control data monitored to adjust the process control prediction model. By way of the method, a re-test does not need to be executed to re-identify a model so as to eliminate a mismatch of the process control prediction model, thereby eliminating an influence of fluctuation introduced by addition of an excitation signal during the re-testing.
    Type: Grant
    Filed: July 13, 2018
    Date of Patent: February 7, 2023
    Assignee: Siemens Aktiengesellschaft
    Inventors: Bo Wen, Zhu Niu, Shun Jie Fan
  • Publication number: 20220091588
    Abstract: Provided are a data acquisition system and method. The system includes: data acquisition units, to acquire a plurality of pieces of data related to a target object within a data acquisition period; and a controller, communicatively connected to the data acquisition units, to set, according to an ith data acquisition period, a sampling interval time of the ith piece of data, and to set a polling interval time according to a minimum data acquisition period of the data acquisition units. Upon the controller starting to perform polling on the data acquisition units through n_1 polling interval times until a condition is satisfied for the first time, the controller performs first polling, for the ith piece of data, on a data acquisition unit of the data acquisition units for acquiring the ith piece of data.
    Type: Application
    Filed: April 26, 2019
    Publication date: March 24, 2022
    Applicant: Siemens Aktiengesellschaft
    Inventors: Wen Bin CAO, Zhu NIU, Shun Jie FAN
  • Publication number: 20210318661
    Abstract: A processor controller includes: a deep neutral network, for extracting, based upon feature information of process control data, from a process control data storage device, process control data available to a production device to be controlled, the feature information of the process control data including at least production device feature parameters and a production device load; and an enhanced neural network, for performing, based upon a process control prediction model, process control prediction by using real-time process control data of said production device. In an embodiment, the process control prediction model is trained by using the extracted available process control data. The process controller further includes a process control decision unit, for determining an operation control instruction for the production device based upon the result of process control prediction.
    Type: Application
    Filed: August 14, 2018
    Publication date: October 14, 2021
    Applicant: Siemens Aktiengesellschaft
    Inventors: Zhu NIU, Bo WEN, Shun Jie FAN
  • Publication number: 20210232106
    Abstract: The present disclosure provides a method and an apparatus for adjusting a process control prediction model, and a process controller. In an embodiment, the method includes: determining, based on controlled variable data in process control data obtained through real-time monitoring, whether a prediction performance of the process control prediction model is lower than a reference performance; and when the prediction performance is determined to be lower than the reference performance, using manipulated variable data in the process control data monitored to adjust the process control prediction model. By way of the method, a re-test does not need to be executed to re-identify a model so as to eliminate a mismatch of the process control prediction model, thereby eliminating an influence of fluctuation introduced by addition of an excitation signal during the re-testing.
    Type: Application
    Filed: July 13, 2018
    Publication date: July 29, 2021
    Applicant: Siemens Aktiengesellschaft
    Inventors: Bo WEN, Zhu NIU, Shun Jie FAN