Abstract: A creping blade and a preparation method thereof are provided. The creping blade comprises a base, wherein a wear-resistant coating is provided on the top of the base, and a protective layer is arranged below the wear-resistant coating at the contact point between the creping blade and a dryer, and the hardness of the protective layer is lower than that of the surface of the dryer of a paper machine. The creping blade of the invention is advantageous in that the friction portion of working surface has an unlimited area and has a high wear-resistant coating, and the paper impact portion has high wear resistance and high impact resistance, so that the creping blade has a long service life, which can be several times or even tens of times that of the common steel creping blade.

Abstract: An addressing system, an addressing apparatus and a computing apparatus are provided. The addressing system includes a first acousto-optic processing component and a second acousto-optic processing component. The first acousto-optic processing component is used for generating a diffraction beam for an addressing operation in a preset number of dimensions. The second acousto-optic processing component is used for determining emitting directions of the generated diffraction beam in various dimensions, and outputting a diffraction beam according to the determined emitting directions to perform an addressing operation for a qubit array in the preset number of dimensions. A first radio frequency of the diffraction beam generated by the first acousto-optic processing component is used for compensating for a second radio frequency of diffraction beams outputted by the second acousto-optic processing component from different emitting directions.

Abstract: A creping blade and a preparation method thereof are provided. The creping blade comprises a base, wherein a wear-resistant coating is provided on the top of the base, and a protective layer is arranged below the wear-resistant coating at the contact point between the creping blade and a dryer, and the hardness of the protective layer is lower than that of the surface of the dryer of a paper machine. The creping blade of the invention is advantageous in that the friction portion of working surface has an unlimited area and has a high wear-resistant coating, and the paper impact portion has high wear resistance and high impact resistance, so that the creping blade has a long service life, which can be several times or even tens of times that of the common steel creping blade.

Abstract: An addressing system, an addressing apparatus and a computing apparatus are provided. The addressing system includes a first acousto-optic processing component and a second acousto-optic processing component. The first acousto-optic processing component is used for generating a diffraction beam for an addressing operation in a preset number of dimensions. The second acousto-optic processing component is used for determining emitting directions of the generated diffraction beam in various dimensions, and outputting a diffraction beam according to the determined emitting directions to perform an addressing operation for a qubit array in the preset number of dimensions. A first radio frequency of the diffraction beam generated by the first acousto-optic processing component is used for compensating for a second radio frequency of diffraction beams outputted by the second acousto-optic processing component from different emitting directions.

Abstract: The disclosure provides a system and method for multi-functional online testing of semiconductor light-emitting devices or modules. The system includes an electrical characteristic generating and testing equipment, one or more optical characteristic detecting and controlling equipments, an optical signal processing and analyzing equipment, one or more thermal characteristic detecting equipments, a central monitoring and processing computer, a multi-channel integrated drive controlling equipment, one or more multi-stress accelerated degradation controlling equipments, and one or more load boards. The present disclosure enables in-situ online monitoring and testing under accelerated degradation in a multi-stress accelerated degradation environment.

Abstract: The disclosure provides a system and method for multi-functional online testing of semiconductor light-emitting devices or modules. The system comprises an electrical characteristic generating and testing equipment, one or more optical characteristic detecting and controlling equipments, an optical signal processing and analyzing equipment, one or more thermal characteristic detecting equipments, a central monitoring and processing computer, a multi-channel integrated drive controlling equipment, one or more multi-stress accelerated degradation controlling equipments, and one or more load boards. The present disclosure enables in-situ online monitoring and testing under accelerated degradation in a multi-stress accelerated degradation environment.