Abstract: Disclosed are a parallel accelerated test method and apparatus that separately applies multiple sensitive stresses to multiple components. Sensitive stress types of different product components are determined respectively, and accelerated test stress values of the different product components are determined respectively based on the sensitive stress types. The overall product acceleration coefficient is determined, the accelerated test stress values of different product components are corrected based on the overall product acceleration coefficient, and the multi-box coordinated deployment scheme is determined based on the sensitive stress types of different product components and the corrected stress values in accelerated test. Based on an accelerated test confidence level and product failure count threshold, a target accelerated test scheme is determined from candidate accelerated test schemes.

Abstract: Disclosed are a parallel accelerated test method and apparatus that separately applies multiple sensitive stresses to multiple components. Sensitive stress types of different product components are determined respectively, and accelerated test stress values of the different product components are determined respectively based on the sensitive stress types. The overall product acceleration coefficient is determined, the accelerated test stress values of different product components are corrected based on the overall product acceleration coefficient, and the multi-box coordinated deployment scheme is determined based on the sensitive stress types of different product components and the corrected stress values in accelerated test. Based on an accelerated test confidence level and product failure count threshold, a target accelerated test scheme is determined from candidate accelerated test schemes.

Abstract: The present disclosure relates to a product testing method and apparatus integrating accelerated life test and accelerated degradation test, computer device, storage medium and computer program product. The method includes, performing failure mode analysis on components of a product to be evaluated, classifying the components into sudden failure components and degradation failure components, performing accelerated life tests on the sudden failure components to determine a first cumulative failure probability function of each of the sudden failure components, performing accelerated degradation tests on the degradation failure components to determine a second cumulative failure probability function of each of the degradation failure components, and determining a reliability of the product to be evaluated based on the first cumulative failure probability function and the second cumulative failure probability function.