Patents by Inventor Zihan Hans Liu
Zihan Hans Liu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20230110558Abstract: The techniques described herein relate to computerized methods and apparatuses for detecting objects in an image. The techniques described herein further relate to computerized methods and apparatuses for detecting one or more objects using a pre-trained machine learning model and one or more other machine learning models that can be trained in a field training process. The pre-trained machine learning model may be a deep machine learning model.Type: ApplicationFiled: October 7, 2022Publication date: April 13, 2023Applicant: Cognex CorporationInventors: Zihan Hans Liu, Philippe Hanhart, Reto Wyss, Simon Alaric Barker
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Patent number: 11562505Abstract: This invention provides a system and method for displaying color match information on an acquired image of an object. A model/pattern having a plurality of color test points at locations of stable color is provided. A display process generates visible geometric shapes with respect to the color test points in a predetermined color. An alignment process aligns features of the object with respect to features on the model so that the geometric shapes appear in locations on the object that correspond to locations on the model. The geometric shapes can comprise closed shapes that surround a region expected to be stable color on the object. Such shapes can define circles, squares, diamonds or any other acceptable closed or open shape that is visible to the user on the display.Type: GrantFiled: March 9, 2019Date of Patent: January 24, 2023Assignee: Cognex CorporationInventors: Jason Davis, Zihan Hans Liu, Nathaniel R. Bogan
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Patent number: 11475593Abstract: The techniques described herein relate to methods, apparatus, and computer readable media configured to test a pose of a model to image data. Image data of an object is received, the image data comprising a set of data entries. A set of regions of the image data are determined, wherein each region in the set of regions comprises an associated set of neighboring data entries in the set of data entries. Processed image data is generated, wherein the processed image data comprises a set of cells that each have an associated value, and generating the processed image data comprises, for each region in the set of regions, determining a maximum possible score of each data entry in the associated set of neighboring data entries from the image data, setting one or more values of the set of values based on the determined maximum possible score, and testing the pose of the model using the processed image data.Type: GrantFiled: November 2, 2020Date of Patent: October 18, 2022Assignee: Cognex CorporationInventors: Nathaniel Bogan, Zihan Hans Liu
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Patent number: 11282220Abstract: Methods, systems, and devices for 3D measurement and/or pattern generation are provided in accordance with various embodiments. Some embodiments include a method of pattern projection that may include projecting one or more patterns. Each pattern from the one or more patterns may include an arrangement of three or more symbols that are arranged such that for each symbol in the arrangement, a degree of similarity between said symbol and a most proximal of the remaining symbols in the arrangement is less than a degree of similarity between said symbol and a most distal of the remaining symbols in the arrangement. Some embodiments further include: illuminating an object using the one or more projected patterns; collecting one or more images of the illuminated object; and/or computing one or more 3D locations of the illuminated object based on the one or more projected patterns and the one or more collected images.Type: GrantFiled: June 28, 2020Date of Patent: March 22, 2022Assignee: Cognex CorporationInventors: Zihan Hans Liu, Nathaniel Bogan, Andrew Hoelscher, Eric Moore, Benjamin Braker
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Publication number: 20210118176Abstract: The techniques described herein relate to methods, apparatus, and computer readable media configured to test a pose of a model to image data. Image data of an object is received, the image data comprising a set of data entries. A set of regions of the image data are determined, wherein each region in the set of regions comprises an associated set of neighboring data entries in the set of data entries. Processed image data is generated, wherein the processed image data comprises a set of cells that each have an associated value, and generating the processed image data comprises, for each region in the set of regions, determining a maximum possible score of each data entry in the associated set of neighboring data entries from the image data, setting one or more values of the set of values based on the determined maximum possible score, and testing the pose of the model using the processed image data.Type: ApplicationFiled: November 2, 2020Publication date: April 22, 2021Applicant: Cognex CorporationInventors: Nathaniel Bogan, Zihan Hans Liu
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Publication number: 20210019896Abstract: Methods, systems, and devices for 3D measurement and/or pattern generation are provided in accordance with various embodiments. Some embodiments include a method of pattern projection that may include projecting one or more patterns. Each pattern from the one or more patterns may include an arrangement of three or more symbols that are arranged such that for each symbol in the arrangement, a degree of similarity between said symbol and a most proximal of the remaining symbols in the arrangement is less than a degree of similarity between said symbol and a most distal of the remaining symbols in the arrangement. Some embodiments further include: illuminating an object using the one or more projected patterns; collecting one or more images of the illuminated object; and/or computing one or more 3D locations of the illuminated object based on the one or more projected patterns and the one or more collected images.Type: ApplicationFiled: June 28, 2020Publication date: January 21, 2021Inventors: Zihan Hans Liu, Nathaniel Bogan, Andrew Hoelscher, Eric Moore, Benjamin Braker
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Patent number: 10846563Abstract: The techniques described herein relate to methods, apparatus, and computer readable media configured to test a pose of a model in three-dimensional data. Three-dimensional data of an object is received, the three-dimensional data comprising a set of data entries. The three-dimensional data is converted to a field comprising a set of cells that each have an associated value, comprising determining, for each cell value, representative data based on one or more data entries from the set of data entries of the three-dimensional data. A pose of the model is tested with the field to determine a score for the pose.Type: GrantFiled: September 12, 2018Date of Patent: November 24, 2020Assignee: Cognex CorporationInventors: Zihan Hans Liu, Nathaniel Bogan, Andrew Hoelscher
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Patent number: 10825199Abstract: The techniques described herein relate to methods, apparatus, and computer readable media configured to test a pose of a model to image data. Image data of an object is received, the image data comprising a set of data entries. A set of regions of the image data are determined, wherein each region in the set of regions comprises an associated set of neighboring data entries in the set of data entries. Processed image data is generated, wherein the processed image data comprises a set of cells that each have an associated value, and generating the processed image data comprises, for each region in the set of regions, determining a maximum possible score of each data entry in the associated set of neighboring data entries from the image data, setting one or more values of the set of values based on the determined maximum possible score, and testing the pose of the model using the processed image data.Type: GrantFiled: September 12, 2018Date of Patent: November 3, 2020Assignee: Cognex CorporationInventors: Nathaniel Bogan, Zihan Hans Liu
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Patent number: 10699429Abstract: Methods, systems, and devices for 3D measurement and/or pattern generation are provided in accordance with various embodiments. Some embodiments include a method of pattern projection that may include projecting one or more patterns. Each pattern from the one or more patterns may include an arrangement of three or more symbols that are arranged such that for each symbol in the arrangement, a degree of similarity between said symbol and a most proximal of the remaining symbols in the arrangement is less than a degree of similarity between said symbol and a most distal of the remaining symbols in the arrangement. Some embodiments further include: illuminating an object using the one or more projected patterns; collecting one or more images of the illuminated object; and/or computing one or more 3D locations of the illuminated object based on the one or more projected patterns and the one or more collected images.Type: GrantFiled: August 16, 2018Date of Patent: June 30, 2020Assignee: Cognex CorporationInventors: Zihan Hans Liu, Nathaniel Bogan, Andrew Hoelscher, Eric Moore, Benjamin Braker
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Publication number: 20200082209Abstract: The techniques described herein relate to methods, apparatus, and computer readable media configured to test a pose of a model in three-dimensional data. Three-dimensional data of an object is received, the three-dimensional data comprising a set of data entries. The three-dimensional data is converted to a field comprising a set of cells that each have an associated value, comprising determining, for each cell value, representative data based on one or more data entries from the set of data entries of the three-dimensional data. A pose of the model is tested with the field to determine a score for the pose.Type: ApplicationFiled: September 12, 2018Publication date: March 12, 2020Applicant: Cognex CorporationInventors: Zihan Hans Liu, Nathaniel Bogan, Andrew Hoelscher
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Publication number: 20200082566Abstract: The techniques described herein relate to methods, apparatus, and computer readable media configured to test a pose of a model to image data. Image data of an object is received, the image data comprising a set of data entries. A set of regions of the image data are determined, wherein each region in the set of regions comprises an associated set of neighboring data entries in the set of data entries. Processed image data is generated, wherein the processed image data comprises a set of cells that each have an associated value, and generating the processed image data comprises, for each region in the set of regions, determining a maximum possible score of each data entry in the associated set of neighboring data entries from the image data, setting one or more values of the set of values based on the determined maximum possible score, and testing the pose of the model using the processed image data.Type: ApplicationFiled: September 12, 2018Publication date: March 12, 2020Applicant: Cognex CorporationInventors: Nathaniel Bogan, Zihan Hans Liu
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Publication number: 20200074685Abstract: This invention provides a system and method for displaying color match information on an acquired image of an object. A model/pattern having a plurality of color test points at locations of stable color is provided. A display process generates visible geometric shapes with respect to the color test points in a predetermined color. An alignment process aligns features of the object with respect to features on the model so that the geometric shapes appear in locations on the object that correspond to locations on the model. The geometric shapes can comprise closed shapes that surround a region expected to be stable color on the object. Such shapes can define circles, squares, diamonds or any other acceptable closed or open shape that is visible to the user on the display.Type: ApplicationFiled: March 9, 2019Publication date: March 5, 2020Inventors: Jason Davis, Zihan Hans Liu, Nathaniel R. Bogan
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Publication number: 20190139242Abstract: Methods, systems, and devices for 3D measurement and/or pattern generation are provided in accordance with various embodiments. Some embodiments include a method of pattern projection that may include projecting one or more patterns. Each pattern from the one or more patterns may include an arrangement of three or more symbols that are arranged such that for each symbol in the arrangement, a degree of similarity between said symbol and a most proximal of the remaining symbols in the arrangement is less than a degree of similarity between said symbol and a most distal of the remaining symbols in the arrangement. Some embodiments further include: illuminating an object using the one or more projected patterns; collecting one or more images of the illuminated object; and/or computing one or more 3D locations of the illuminated object based on the one or more projected patterns and the one or more collected images.Type: ApplicationFiled: August 16, 2018Publication date: May 9, 2019Inventors: Zihan Hans Liu, Nathaniel Bogan, Andrew Hoelscher, Eric Moore, Benjamin Braker
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Patent number: 9036924Abstract: Method for classifying a two- or higher dimensional image, where each pixel is associated with M property measures, includes identifying firstly a certain predetermined, variable geometric structure, the extension of which in at least two of the N dimensions in the dataset is determined in relation to a single element in the dataset and by at least one variable parameter, and secondly at least one geometric measure associated with the variable geometric structure, which geometric measure is arranged to measure a geometric property of a specific geometric structure in relation to other specific such geometric structures, and in that a main classification is conducted of the dataset, which main classification is based upon a comparative measure between the respective sets of associated geometric measures of two elements, calculated from a respective maximal geometric structure for each element.Type: GrantFiled: September 9, 2011Date of Patent: May 19, 2015Assignee: Choros Cognition ABInventors: Anders Brun, Zihan Hans Liu, Anders Wästfelt, Bo Malmberg, Michael Nielsen
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Publication number: 20130230257Abstract: Method for classifying a two- or higher dimensional image, where each pixel is associated with M property measures, includes identifying firstly a certain predetermined, variable geometric structure, the extension of which in at least two of the N dimensions in the dataset is determined in relation to a single element in the dataset and by at least one variable parameter, and secondly at least one geometric measure associated with the variable geometric structure, which geometric measure is arranged to measure a geometric property of a specific geometric structure in relation to other specific such geometric structures, and in that a main classification is conducted of the dataset, which main classification is based upon a comparative measure between the respective sets of associated geometric measures of two elements, calculated from a respective maximal geometric structure for each element.Type: ApplicationFiled: September 9, 2011Publication date: September 5, 2013Applicant: CHOROS COGNITION ABInventors: Anders Brun, Zihan Hans Liu, Anders Wästfelt, Bo Malmberg, Michael Nielsen