Patents by Inventor Zihao Ouyang

Zihao Ouyang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10752994
    Abstract: An apparatus for depositing a coating on a substrate at atmospheric pressure comprises (a) a plasma torch comprising a microwave source coupled to an antenna disposed within a chamber having an open end, the chamber comprising a gas inlet for flow of a gas over the antenna to generate a plasma jet; (b) a substrate positioned outside the open end of the chamber a predetermined distance away from a tip of the antenna; and (c) a target material to be coated on the substrate disposed at the tip of the antenna.
    Type: Grant
    Filed: November 21, 2018
    Date of Patent: August 25, 2020
    Assignee: THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
    Inventors: David N. Ruzic, Yuilun Wu, Ivan Shchelkanov, Jungmi Hong, Zihao Ouyang, Tae Seung Cho
  • Patent number: 10361091
    Abstract: A method for etching features into a porous low-k dielectric etch layer is provided. A plurality of cycles is performed in a plasma processing chamber. Each cycle comprises a deposition phase and an activation phase. The deposition phase comprises flowing a deposition gas comprising a fluorocarbon and/or hydrofluorocarbon gas, creating a plasma in the plasma processing chamber using the deposition gas, depositing a fluorocarbon or hydrofluorocarbon containing layer, and stopping the flow of the deposition gas. The activation phase comprises flowing an activation gas comprising a noble gas and a carbon etching additive, creating a plasma in the plasma processing chamber using the activation gas, providing an activation bias in the plasma processing chamber, wherein the activation bias causes the etching of the low-k dielectric layer, with consumption of the fluorocarbon or hydrofluorocarbon containing layer, and stopping the flow of the activation gas.
    Type: Grant
    Filed: May 31, 2017
    Date of Patent: July 23, 2019
    Assignee: Lam Research Corporation
    Inventors: Eric Hudson, Shashank Deshmukh, Sonny Li, Chia-Chun Wang, Prabhakara Gopaladasu, Zihao Ouyang
  • Publication number: 20190093229
    Abstract: An apparatus for depositing a coating on a substrate at atmospheric pressure comprises (a) a plasma torch comprising a microwave source coupled to an antenna disposed within a chamber having an open end, the chamber comprising a gas inlet for flow of a gas over the antenna to generate a plasma jet; (b) a substrate positioned outside the open end of the chamber a predetermined distance away from a tip of the antenna; and (c) a target material to be coated on the substrate disposed at the tip of the antenna.
    Type: Application
    Filed: November 21, 2018
    Publication date: March 28, 2019
    Applicant: The Board of Trustees of the University of Illinois
    Inventors: David N. Ruzic, Yuilun Wu, Ivan Shchelkanov, Jungmi Hong, Zihao Ouyang, Tae Seung Cho
  • Patent number: 10167556
    Abstract: An apparatus for depositing a coating on a substrate at atmospheric pressure comprises (a) a plasma torch comprising a microwave source coupled to an antenna disposed within a chamber having an open end, the chamber comprising a gas inlet for flow of a gas over the antenna to generate a plasma jet; (b) a substrate positioned outside the open end of the chamber a predetermined distance away from a tip of the antenna; and (c) a target material to be coated on the substrate disposed at the tip of the antenna.
    Type: Grant
    Filed: March 13, 2015
    Date of Patent: January 1, 2019
    Assignee: THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
    Inventors: David N. Ruzic, Yuilun Wu, Ivan Shchelkanov, Jungmi Hong, Zihao Ouyang, Tae Seung Cho
  • Publication number: 20180350618
    Abstract: A method for etching features into a porous low-k dielectric etch layer is provided. A plurality of cycles is performed in a plasma processing chamber. Each cycle comprises a deposition phase and an activation phase. The deposition phase comprises flowing a deposition gas comprising a fluorocarbon and/or hydrofluorocarbon gas, creating a plasma in the plasma processing chamber using the deposition gas, depositing a fluorocarbon or hydrofluorocarbon containing layer, and stopping the flow of the deposition gas. The activation phase comprises flowing an activation gas comprising a noble gas and a carbon etching additive, creating a plasma in the plasma processing chamber using the activation gas, providing an activation bias in the plasma processing chamber, wherein the activation bias causes the etching of the low-k dielectric layer, with consumption of the fluorocarbon or hydrofluorocarbon containing layer, and stopping the flow of the activation gas.
    Type: Application
    Filed: May 31, 2017
    Publication date: December 6, 2018
    Inventors: Eric HUDSON, Shashank DESHMUKH, Sonny LI, Chia-Chun WANG, Prabhakara GOPALADASU, Zihao OUYANG
  • Publication number: 20150259802
    Abstract: An apparatus for depositing a coating on a substrate at atmospheric pressure comprises (a) a plasma torch comprising a microwave source coupled to an antenna disposed within a chamber having an open end, the chamber comprising a gas inlet for flow of a gas over the antenna to generate a plasma jet; (b) a substrate positioned outside the open end of the chamber a predetermined distance away from a tip of the antenna; and (c) a target material to be coated on the substrate disposed at the tip of the antenna.
    Type: Application
    Filed: March 13, 2015
    Publication date: September 17, 2015
    Inventors: David N. Ruzic, Yuilun Wu, Ivan Shchelkanov, Jungmi Hong, Zihao Ouyang, Tae Seung Cho