Patents by Inventor Zirong Zahi

Zirong Zahi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Light modulation for inspection probes
    Patent number: 11125551
    Abstract: A probe system and a method are provided. The probe system includes an emitter unit, a pattern generation system, and an intensity modulator. The emitter unit is for emitting light. The pattern generation system is for projecting at least one reference structured-light pattern onto an object surface to obtain at least one reference projected pattern, and including a mirror scanning unit for reflecting the light to a plurality of directions. The intensity modulator is for modulating intensity of the light according to the at least one reference projected pattern to provide modulated light to the mirror scanning unit to reflect the modulated light to the plurality of directions to project at least one modulated structured-light pattern onto the object surface to obtain at least one modulated projected pattern.
    Type: Grant
    Filed: August 11, 2017
    Date of Patent: September 21, 2021
    Assignee: BAKER HUGHES, A GE COMPANY, LLC
    Inventors: Zirong Zahi, Kevin George Harding, Jie Han, Dongmin Yang, Clark Alexander Bendall, Jijun Gu
  • Probe System and Method
    Publication number: 20180045510
    Abstract: A probe system and a method are provided. The probe system includes an emitter unit, a pattern generation system, and an intensity modulator. The emitter unit is for emitting light. The pattern generation system is for projecting at least one reference structured-light pattern onto an object surface to obtain at least one reference projected pattern, and including a mirror scanning unit for reflecting the light to a plurality of directions. The intensity modulator is for modulating intensity of the light according to the at least one reference projected pattern to provide modulated light to the mirror scanning unit to reflect the modulated light to the plurality of directions to project at least one modulated structured-light pattern onto the object surface to obtain at least one modulated projected pattern.
    Type: Application
    Filed: August 11, 2017
    Publication date: February 15, 2018
    Inventors: Zirong Zahi, Kevin George Harding, Jie Han, Dongmin Yang, Clark Alexander Bendall, Jijun Gu