Patents by Inventor Ziyi Zhu

Ziyi Zhu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Measurement apparatus of wavefront and polarization profile of vectorial optical fields
    Patent number: 11709097
    Abstract: An apparatus measures the transverse profile of vectorial optical field beams, including both the phase and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for both fundamental studies of vectorial optical fields and a wide spectrum of applications, including microscopy, surveillance, imaging, communication, material processing, and laser trapping.
    Type: Grant
    Filed: July 19, 2021
    Date of Patent: July 25, 2023
    Assignee: University of South Florida
    Inventors: Zhimin Shi, Darrick Hay, Ziyi Zhu, Yiyu Zhou, Robert W. Boyd
  • MEASUREMENT APPARATUS OF WAVEFRONT AND POLARIZATION PROFILE OF VECTORIAL OPTICAL FIELDS
    Publication number: 20220011163
    Abstract: An apparatus measures the transverse profile of vectorial optical field beams, including both the phase and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for both fundamental studies of vectorial optical fields and a wide spectrum of applications, including microscopy, surveillance, imaging, communication, material processing, and laser trapping.
    Type: Application
    Filed: July 19, 2021
    Publication date: January 13, 2022
    Applicants: The University of Rochester, University of South Florida
    Inventors: Zhimin Shi, Darrick Hay, Ziyi Zhu, Yiyu Zhou, Robert W. Boyd
  • Measurement apparatus of wavefront and polarization profile of vectorial optical fields
    Patent number: 11067450
    Abstract: An apparatus measures the transverse profile of vectorial optical field beams, including both the phase and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for both fundamental studies of vectorial optical fields and a wide spectrum of applications, including microscopy, surveillance, imaging, communication, material processing, and laser trapping.
    Type: Grant
    Filed: May 6, 2019
    Date of Patent: July 20, 2021
    Assignee: University of South Florida
    Inventors: Zhimin Shi, Darrick Hay, Ziyi Zhu, Yiyu Zhou, Robert W. Boyd
  • MEASUREMENT APPARATUS OF WAVEFRONT AND POLARIZATION PROFILE OF VECTORIAL OPTICAL FIELDS
    Publication number: 20200011737
    Abstract: An apparatus measures the transverse profile of vectorial optical field beams, including both the phase and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for both fundamental studies of vectorial optical fields and a wide spectrum of applications, including microscopy, surveillance, imaging, communication, material processing, and laser trapping.
    Type: Application
    Filed: May 6, 2019
    Publication date: January 9, 2020
    Applicants: The University of Rochester, University of South Florida
    Inventors: Zhimin Shi, Darrick Hay, Ziyi Zhu, Yiyu Zhou, Robert W. Boyd