Patents by Inventor Zohar RINGEL

Zohar RINGEL has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for processing spin magnetometry data
    Patent number: 11953457
    Abstract: The present invention provides method for processing spin magnetometry data of a sample, said data generated with a point defects-based spin magnetometer, and for providing information on the presence and properties of a particular compound in the sample, wherein said method comprises: (1) Subjecting the sample to a spin magnetometry measurement with the point defects-based spin magnetometer to generate a string or an array of the spin measurement results of said sample, said string or an array of the spin measurement results is an input for an external memory; and (2) Applying a deep-learning method on said spin measurement results in the external memory to output a single bit whose value is ‘0’ or ‘1’, or an array of bits, or an array of integers, or an array of complex numbers, wherein said single bit, or said array of bits, or said array of integers, or said array of complex numbers corresponds to an estimated frequency and/or an amplitude of the input, thereby providing information on the presence and p
    Type: Grant
    Filed: September 5, 2019
    Date of Patent: April 9, 2024
    Assignee: YISSUM RESEARCH DEVELOPMENT COMPANY OF THE HEBREW UNIVERSITY OF JERUSALEM LTD.
    Inventors: Alexander Retzker, Zohar Ringel, Netanel Aharon
  • METHOD FOR PROCESSING SPIN MAGNETOMETRY DATA
    Publication number: 20210318256
    Abstract: The present invention provides method for processing spin magnetometry data of a sample, said data generated with a point defects-based spin magnetometer, and for providing information on the presence and properties of a particular compound in the sample, wherein said method comprises: (1) Subjecting the sample to a spin magnetometry measurement with the point defects-based spin magnetometer to generate a string or an array of the spin measurement results of said sample, said string or an array of the spin measurement results is an input for an external memory; and (2) Applying a deep-learning method on said spin measurement results in the external memory to output a single bit whose value is ‘0’ or ‘1’, or an array of bits, or an array of integers, or an array of complex numbers, wherein said single bit, or said array of bits, or said array of integers, or said array of complex numbers corresponds to an estimated frequency and/or an amplitude of the input, thereby providing information on the presence and p
    Type: Application
    Filed: September 5, 2019
    Publication date: October 14, 2021
    Inventors: Alexander RETZKER, Zohar RINGEL, Netanel AHARON