Abstract: A decoder element is provided with an output, whereby an output signal with one of three different possible potentials is produced. The output signal may have a value of either a first potential, a second potential, and a third potential, where the second potential lies between the first potential and the third potential. The output signal is produced according to voltage values of input signals at terminal connections of the decoder element.

Abstract: The invention relates to a circuit configuration for equalizing different voltages on line runs in integrated semiconductor circuits, where the bit line and the plate line have a voltage equalization transistor provided between them which, in normal operation of the semiconductor circuit, can be switched to low impedance by a control signal in order to equalize the different voltages on the lines.

Abstract: The integrated memory has m>1 bit lines that are connected to an input of a read-write amplifier via a switching element. Only one switching element is conductively connected for each read or write access. The memory is provided with a switching unit that influences read or write access occurring by way of the read-write amplifier and bit lines. The circuit unit is provided with an activation input. A column-end decoder has a first decoder stage and m second decoder stages. The outputs of the second decoder stages are connected to a control input for each of the switching elements. The output of the first decoder stage is connected to the activation input of the switching unit.

Abstract: A CMOS voltage divider having a first chain containing series-connected MOS transistors of a first conductivity type is described. Each of the MOS transistors have identical geometrical dimensions and, at the same time, each have identical gate-source voltages. The MOS transistors operate in the linear range of their characteristic curve and between opposite ends of the first chain an input voltage to be divided is present and at whose source terminals the voltage fractions can in each case be picked off. Provision is made of a second chain containing series-connected MOS transistors, complementary to the first MOS transistors. The second chain has the same number of transistors as the first MOS transistors and with the same geometrical dimension in each case. The MOS transistors of the first chain are connected to the MOS transistors of the second chain in such a way that each MOS transistor chain generates the gate-source bias voltage for the respective other MOS transistor chain.

Abstract: The decoder element is used for producing an output signal having three different potentials at an output. The second potential is situated between the first potential and the third potential. The decoder element makes it possible to produce any one of the three potentials at its output based upon the potentials on its connections.

Abstract: A semiconductor memory, in particular a ferroelectric semiconductor memory, has a differential write/read amplifier which is connected, via transfer transistors, to a bit line pair. The bit line pair includes a bit line and a corresponding reference bit line. The differential write/read amplifier is for reading data from and writing data to the memory capacitor (MC). In order to improve the accuracy of the bit line reference voltage, a main reference bit line is connected, via a charge switching element, to a reference voltage. At least one further reference bit line is connected to the main reference bit line via an equalization switching element for charge equalization between the reference bit lines.

Abstract: An integrated semiconductor memory has memory cells that are combined to form addressable normal units and to form at least one redundant unit for replacing one of the normal units. In addition, the semiconductor memory has an address bus to which an address can be applied, and a redundancy circuit that is connected to the address bus. The redundancy circuit is used to select the redundant unit. An input of a processing unit is connected to a connection of the address bus and also to a connection for a test signal, and the output of the processing unit is connected to an input of the redundancy circuit. The redundant unit can be tested before the repair information is programmed in the redundancy circuit. The circuit complexity required for this is comparatively low.

Abstract: An integrated circuit has first structures that are produced in a plurality of wiring planes using exposure masks and serve for producing a functionality required by the user of the circuit. The circuit also has second structures that are produced in a plurality of the wiring planes using the exposure masks and do not serve for the particular functionality, but rather for the capability of checking if the exposure masks used belonged to a common mask set.

Abstract: An integrated memory includes a cell array having memory cells disposed at points of intersection of first bit lines and second bit lines with word lines in the cell array. When one of the memory cells is addressed, the memory content is not affected if respective bit lines associated with each of the memory cells are at a standby potential. Sense amplifiers for amplifying data read from the memory cells onto the bit lines are included, each associated with respective first and second bit lines and disposed on opposite sides of the cell array. Also provided are first switching elements, through which each bit line is connected to the associated sense amplifier, and second switching elements, through which each bit line is connected, on that side of its first switching element which is remote from the associated sense amplifier, to a standby potential.

Abstract: An integrated circuit includes a decoder having an output terminal and five input terminals. The decoder has three operating states including a first operating state for generating a first potential at the output terminal, a second operating state for generating a second potential at the output terminal, and a third operating state for generating a third potential at the output terminal. The second potential lies between the first potential and the third potential.

Abstract: The memory has a control unit, which, in order to generate a common reference potential on the two bit lines, turns on the first switching element and the selection transistors of the two reference memory cells and, after a specific time period, turns off the selection transistors, while the first switching element remains in the on state and compensates for a potential difference between the two bit lines.

Abstract: An integrated circuit has a first voltage generator, which is connected via a first switching element to a contact-making point for external contact making with the circuit. In addition, it has a first digital control device, via which the contact-making point is connected to a control input of the first switching element. In this case, the first control device switches the first switching element on or turns the latter off by a first digital control signal, the level of which is dependent on the potential of the contact-making point. Furthermore, the contact-making point is connected to the input of a second digital control device, which supplies a digital operating mode signal at its output, the level of which operating mode signal is dependent on the potential of the contact-making point.

Abstract: A circuit configuration for reducing disturbances due to a switching of an output driver. The output driver has a plurality of output driver stages and a delay element. The delay element increases the signal delay of the switch-on or switch-off signals for the output driver stages with an increasing supply voltage.

Abstract: An input amplifier for input signals with steep edges has a MOS transistor, whose source or drain is connected to a node connected to an output stage. The output signal is fed back into the amplifier which prevents the MOS transistor from being turned off by steep edge input signals. The node is pulled up to the operating voltage as soon as the input signal is present.

Abstract: The level converting circuit has first and second transistors of a first conductivity type. The control terminals of the transistors are connected to a first supply potential via the load path of the respective other transistor. A load path of a third transistor of a second conductivity type is connected between the control terminal of the first transistor and a reference-ground potential. The control terminal of the third transistor is coupled to the input of the level converting circuit. A node between the second and third transistors forms the output of the circuit. A fourth transistor of the second conductivity type has a load path connected between the control terminal of the second transistor and the control terminal of the third transistor. A capacitance is connected between the control terminals of third and fourth transistors. A limiter circuit is connected upstream of the control terminal of the fourth transistor.