Abstract: A method for manufacturing a semiconductor device includes: providing a wafer-bonding stack structure having a sidewall layer and an exposed first component layer; forming a photoresist layer on the first component layer; performing an edge trimming process to at least remove the sidewall layer; and removing the photoresist layer. In this way, contaminant particles generated from the blade during the edge trimming process may fall on the photoresist layer but not fall on the first component layer, so as to protect the first component layer from being contaminated.

Abstract: A method and an electronic device for selecting influence indicators by using an automatic mechanism are provided. The method includes following steps. Raw data is obtained, where the raw data includes a body-related variable and a plurality of to-be-measured indicators corresponding to the body-related variable. The body-related variable is set as a target parameter. The body-related variable and the to-be-measured indicators are input into a plurality of validation models, and the to-be-measured indicators are sorted according an output result of the validation models to obtain ranking data. Importance of the to-be-measured indicators is calculated by using a screening condition according to the ranking data, so as to select a candidate indicator from the to-be-measured indicators. An influence indicator is determined by calculating a correlation between the candidate indicator and the body-related variable.

Abstract: A method and an electronic device for selecting influence indicators by using an automatic mechanism are provided. The method includes following steps. Raw data is obtained, where the raw data includes a body-related variable and a plurality of to-be-measured indicators corresponding to the body-related variable. The body-related variable is set as a target parameter. The body-related variable and the to-be-measured indicators are input into a plurality of validation models, and the to-be-measured indicators are sorted according an output result of the validation models to obtain ranking data. Importance of the to-be-measured indicators is calculated by using a screening condition according to the ranking data, so as to select a candidate indicator from the to-be-measured indicators. An influence indicator is determined by calculating a correlation between the candidate indicator and the body-related variable.