Abstract: Disclosed are a test signal access board and a lighting jig, including: a substrate layer; and a data signal access part arranged on the substrate layer and including at least two rows of conductive contacts, where the conductive contacts are configured to be electrically connected with data signal test leads of a display panel; the conductive contacts in adjacent rows are arranged in a staggered manner; and a staggered pitch between the conductive contacts in adjacent rows is less than a pitch between the data signal test leads of the display panel.

Abstract: Disclosed are a test signal access board and a lighting jig, including: a substrate layer; and a data signal access part arranged on the substrate layer and including at least two rows of conductive contacts, where the conductive contacts are configured to be electrically connected with data signal test leads of a display panel; the conductive contacts in adjacent rows are arranged in a staggered manner; and a staggered pitch between the conductive contacts in adjacent rows is less than a pitch between the data signal test leads of the display panel.

Abstract: A workbench for mounting an electrical function test unit includes: a mounting surface for mounting the electrical function test unit, wherein the mounting surface is provided with a connecting area, and a number of mounting through holes are arranged in the connecting area; and connectors detachably connected with the mounting through holes and configured to match with mounting screws of the electrical function test unit when the electrical function test unit is mounted on the workbench. The workbench has long service life, reduces the replacement difficulty of the electrical function test unit and shortens the downtime, thereby improving the detection efficiency of the display screen.

Abstract: The present disclosure provides a lighting-on device and a method for cell test. The lighting-on device includes a movable unit including a first marker; an image acquisition unit configured to acquire an image indicating an actual relative positional relationship between the first marker and a second marker on a display panel; a calculation unit configured to calculate the actual relative positional relationship between the first marker and the second marker according to the image; a first position adjustment unit configured to drive the movable unit so as to adjust the actual relative positional relationship; and a first control unit configured to determine whether the adjusted actual relative positional relationship has been aligned by the first position adjustment unit according to the relative positional relationship between the first marker and the second marker.

Abstract: The present disclosure provides a shorting bar structure and a method for manufacturing the same, and a Thin Film Transistor (TFT) substrate. The shorting bar structure comprises: a test wire; a test probe contact part connected to the test wire and configured to be able to contact with a test probe; and at least one PN junction structure located between the test wire and at least one wire under test, and configured to allow a test signal to be unidirectionally transmittable in a direction from the test wire to the wire under test.

Abstract: A test circuit including: a plurality of first leads; a plurality of controllable switches each having a control terminal for receiving a control signal, a first terminal connected to a respective one of the plurality of first leads, and a second terminal for connection to a respective first signal line; and at least two short-circuit lines intersecting the first leads. Each of the short-circuit lines is connected to a respective subset of the plurality of first leads. Each of the plurality of first leads belongs to a corresponding one of the respective subsets, and the respective subsets are disjoint from each other.

Abstract: An automatic optic inspection device and an inspection system for a display panel. The automatic optic inspection device includes: a housing including at least a top wall and a side wall, the side wall including a viewing port; a slide rail fixed on the housing near the top wall; and a camera slidably disposed below the slide rail. An optical axis of the camera passes through the viewing port. During the inspection, the camera is moved on the slide rails so that the camera is close to the stage of the lighting inspection machine and can perform automatic optic inspection of the display panel. When the automatic optic inspection device fails to inspect due to a fault, the camera can be moved along the slide rail so that the camera is moved away from the stage and manual inspection can take place while the inspection device is fixed.

Abstract: A workbench for mounting an electrical function test unit includes: a mounting surface for mounting the electrical function test unit, wherein the mounting surface is provided with a connecting area, and a number of mounting through holes are arranged in the connecting area; and connectors detachably connected with the mounting through holes and configured to match with mounting screws of the electrical function test unit when the electrical function test unit is mounted on the workbench. The workbench has long service life, reduces the replacement difficulty of the electrical function test unit and shortens the downtime, thereby improving the detection efficiency of the display screen.

Abstract: The present disclosure provides a lighting-on device and a method for cell test. The lighting-on device includes a movable unit including a first marker; an image acquisition unit configured to acquire an image indicating an actual relative positional relationship between the first marker and a second marker on a display panel; a calculation unit configured to calculate the actual relative positional relationship between the first marker and the second marker according to the image; a first position adjustment unit configured to drive the movable unit so as to adjust the actual relative positional relationship; and a first control unit configured to determine whether the adjusted actual relative positional relationship has been aligned by the first position adjustment unit according to the relative positional relationship between the first marker and the second marker.

Abstract: The present disclosure provides a shorting bar structure and a method for manufacturing the same, and a Thin Film Transistor (TFT) substrate. The shorting bar structure comprises: a test wire; a test probe contact part connected to the test wire and configured to be able to contact with a test probe; and at least one PN junction structure located between the test wire and at least one wire under test, and configured to allow a test signal to be unidirectionally transmittable in a direction from the test wire to the wire under test.