Patents by Inventor Zunfeng WANG

Zunfeng WANG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Device and method of testing dual-frequency nonlinear vector network parameters
    Patent number: 10168369
    Abstract: A device and method of testing the dual-frequency nonlinear vector network parameters. In view of the challenge of the nonlinear behavioral model characterization of the microwave device components, and the current situation of the nonlinear vector network parameter testing, the disclosed device and method of testing the dual-frequency nonlinear vector network parameters redefines the nonlinear model parameters of the nonlinear device components, gives the definition of the test parameter (W-parameter), solves the challenges of the dual-frequency nonlinear behavioral model characterization and testing for the microwave device components, and makes it more convenient to measure the nonlinear characteristics of the mixer, amplifier and passive device components.
    Type: Grant
    Filed: September 6, 2016
    Date of Patent: January 1, 2019
    Assignee: THE 41ST INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION
    Inventors: Baoguo Yang, Fushun Nian, Shengli Liang, Shubiao Li, Zunfeng Wang, Zhiying Cao, Qinglong Zhang, Mingmin Li
  • DEVICE AND METHOD OF TESTING DUAL-FREQUENCY NONLINEAR VECTOR NETWORK PARAMETERS
    Publication number: 20180238946
    Abstract: A device and method of testing the dual-frequency nonlinear vector network parameters. In view of the challenge of the nonlinear behavioral model characterization of the microwave device components, and the current situation of the nonlinear vector network parameter testing, the disclosed device and method of testing the dual-frequency nonlinear vector network parameters redefines the nonlinear model parameters of the nonlinear device components, gives the definition of the test parameter (W-parameter), solves the challenges of the dual-frequency nonlinear behavioral model characterization and testing for the microwave device components, and makes it more convenient to measure the nonlinear characteristics of the mixer, amplifier and passive device components.
    Type: Application
    Filed: September 6, 2016
    Publication date: August 23, 2018
    Applicant: The 41st Institute of China Electronics Technology Group Corporation
    Inventors: Baoguo YANG, Fushun NIAN, Shengli LIANG, Shubiao LI, Zunfeng WANG, Zhiying CAO, Qinglong ZHANG, Mingmin LI