Patents by Inventor Zvonimr Skocic

Zvonimr Skocic has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for improved inspection classification of attributes of a workpiece
    Patent number: 7047153
    Abstract: An apparatus for detecting the probable existence, location, and type of defects in a workpiece is described. The apparatus includes a sensor subsystem, an optimizer, a control subsystem, and a computer system having a processor and computer readable memory. Sensor subsystem senses a first section of the workpiece and produces signals corresponding to a physical characteristic of the workpiece. The computer system is configured to generate a workpiece model based on the signals produced by the sensor subsystem. In an alternate embodiment, a defect assembler can be provided to merge signals from a plurality of sensor subsystems. The defect assembler can also be configured to generate the workpiece data model. The optimizer is configured to generate workpiece segmentation recommendations based on the workpiece data model.
    Type: Grant
    Filed: July 28, 2004
    Date of Patent: May 16, 2006
    Assignee: Coe Newnes/McGehee Inc.
    Inventors: Steve C. Woods, Michael McGuire, Harry Ogloff, Zvonimr Skocic, Emeric Johnson
  • Method and apparatus for improved inspection and classification of attributes of a workpiece
    Patent number: 6594590
    Abstract: An apparatus for detecting the probable existence, location, and type of defects in a workpiece is described. The apparatus includes a sensor subsystem, an optimizer, a control subsystem, and a computer system having a processor and computer readable memory. The sensor subsystem senses a first section of the workpiece and produces signals corresponding to a physical characteristic of the workpiece. The computer system is configured to generate a workpiece model based on the signals produced by the sensor subsystem. In an alternate embodiment, a defect assembler can be provided to merge signals front a plurality of sensor subsystems. The defect assembler can also be configured to generate the workpiece data model. The optimizer is configured to generate workpiece segmentation recommendations based on the workpiece data model.
    Type: Grant
    Filed: July 5, 2001
    Date of Patent: July 15, 2003
    Assignee: Coe Newnes/McGehee ULC
    Inventors: Steve C. Woods, Michael McGuire, Harry Ogloff, Zvonimr Skocic, Emeric Johnson
  • Method and apparatus for improved inspection and classification of attributes of a workpiece
    Patent number: 6272437
    Abstract: An apparatus for detecting the probable existence, location, and type of defects in a workpiece is described. The apparatus includes a sensor subsystem, an optimizer, a control subsystem, and a computer system having a processor and computer readable memory. Sensor subsystem senses a first section of the workpiece and produces signals corresponding to a physical characteristic of the workpiece. The computer system is configured to generate a workpiece model based on the signals produced by the sensor subsystem. In an alternate embodiment, a defect assembler can be provided to merge signals from a plurality of sensor subsystems. The defect assembler can also be configured to generate the workpiece data model. The optimizer is configured to generate workpiece segmentation recommendations based on the workpiece data model.
    Type: Grant
    Filed: April 17, 1998
    Date of Patent: August 7, 2001
    Assignee: CAE Inc.
    Inventors: Steve C. Woods, Michael McGuire, Harry Ogloff, Zvonimr Skocic, Emeric Johnson