INTEGRATED CIRCUIT AND METHOD FOR OBTAINING TECHNICAL INFORMATION OF THE INTEGRATED CIRCUIT
A method for obtaining technical information of IC is disclosed. The method provides an IC, a test board, and a computer. The IC includes a memory. The memory stores technical information. Connect the IC to the test board. Connect the test board to the computer. The computer obtains the technical information from the memory of IC. Using this method, engineers can find the technical information of the IC conveniently and correctly.
The present invention relates to an integrated circuit (IC) and a method for obtaining technical information of the IC.
DESCRIPTION OF RELATED ARTWhenever working with integrated circuits (ICs), engineers need to know parameters and capabilities of the IC. Although these information are supplied in manuals provided by suppliers, the manual is usually a separate entity from the IC. Engineers may have to spend a significant amount of time locating the manual. The manual may also be lost, thus not locatable. Suppliers may also provide the technical information over a network. Engineers may log into a related website to find corresponding technical information. However, the website usually provides an abundant of information other than the related technical information, resulting in engineer spending a huge amount of time browsing through the website before locating the corresponding technical information. Furthermore, the engineer may not even locate the corresponding technical information or may locate a wrong or irrelevant technical information.
Therefore, what is needed is a method for obtaining technical information of an IC conveniently and correctly.
SUMMARY OF INVENTIONA method for obtaining technical information of an IC is provided herein. The method provides an IC, a test board, and a computer. The IC includes a memory. The memory stores technical information. Connect the IC to the test board. Connect the test board to the computer. Obtain the technical information from the memory of IC.
Further features and advantages will be provided or will become apparent in the course of the following detailed description.
BRIEF DESCRIPTION OF DRAWINGS
Referring to
The test board 2 is connected to a computer 4 by a signal link 3. The signal link 3 can be any suitable communication interface, such as, for example, USB port, RS-232 port, and the like. The computer 4 obtains the technical information from the memory of IC 1.
Referring to
Moreover, it is to be understood that the invention may be embodied in other forms without departing from the spirit thereof. Thus, the present examples and embodiments are to be considered in all respects as illustrative and not restrictive, and the invention is not to be limited to the details given herein.
Claims
1. An IC used in a test board, the IC comprising:
- a memory storing technical information;
- wherein the IC is connected to a computer and transfers the technical information to the computer.
2. The IC of claim 1, wherein the technical information comprises specifications and development manuals.
3. The IC of claim 1, wherein the technical information is in a read-only form.
4. A method for obtaining technical information of an IC, the method comprising the steps of:
- providing an IC comprising a memory, wherein the memory stores technical information;
- connecting the IC to a test board and connecting the test board to a computer; and
- obtaining the technical information from the memory of the IC.
5. The method of claim 4, wherein the technical information comprises specifications and development manuals.
6. The method of claim 4, wherein the technical information is in a read-only form.
Type: Application
Filed: Jul 27, 2006
Publication Date: Apr 12, 2007
Inventors: Han-Che Wang (Shenzhen), Kuan-Hong Hsieh (Shenzhen), Shin-Hong Chung (Shenzhen)
Application Number: 11/309,336
International Classification: G06K 19/06 (20060101);