TESTING PROBE AND TESTING DEVICE
The invention provides a testing probe, which includes a base, an elastic extensible element and a probe needle, the probe needle being disposed on the base through the elastic extensible element, and the elastic extensible element being in a stretched state. By the testing probe provided by the invention, only coating silver adhesive on the testing area of the liquid crystal screen previously is needed, and the steps of making solder wire, fixing solder wire, etc. are not needed any more. Therefore not only the preparation before testing can be simplified largely, but also reliability of connection is ensured, so as to reduce testing time largely and improve testing efficiency. The invention further provides a testing device including the above testing probe.
The invention refers to a technical field of display testing, and specifically to a testing probe and testing device.
BACKGROUNDDuring manufacturing of liquid crystal display, for guaranteeing product quality, it is normally needed to test for optical parameters (such as VT, RT, etc.) of the product. Currently, optical devices such as DMS9000 are normally employed for testing, and before testing some preparation is needed so as to connect detecting signal lines of the optical device to testing area of the liquid crystal screen, and connection way thereof is as shown in
The technical problem to be solved by the invention is providing a testing probe and testing device which can simplify the preparation before testing and improve testing efficiency.
(2) Technical SolutionTo solve the above technical solution, the invention provides a testing probe, which is characterized by including a base, an elastic extensible element and a probe needle, the probe needle being disposed on the base through the elastic extensible element, and the elastic extensible element being in a stretched state.
According to an embodiment, the probe needle contacts the base under effect of tension of the elastic extensible element.
According to an embodiment, the base has a depression, and the elastic extensible element is disposed at the depression.
According to an embodiment, the depth of the depression is larger than the height of the elastic extensible element in a nature state.
According to an embodiment, the longitudinal section of the base is of an L-like shape or is concave.
According to an embodiment, the testing probe includes multiple elastic extensile elements.
According to an embodiment, the probe needle is disposed on the base through a first elastic extensile element stretched and a second elastic extensile element compressed.
According to an embodiment, the probe needle includes a needle rod portion and a needle head portion, and the range of the angle between the needle rod portion and the needle head portion is from 90 degree to 160 degree.
According to an embodiment, the tip of the probe needle is at the same level with the bottom of the base or below the level.
According to an embodiment, the testing probe further includes a probe needle carrier for carrying the probe needle, and through the probe needle carrier, the probe needle connects to the elastic extensible element and is disposed on the base.
For solving the above technical problem, the invention further provides a testing device, which includes any one of the above probes.
(3) Beneficial EffectBy the testing probe provided by the invention, only coating silver adhesive on the testing area of the liquid crystal screen previously is needed, and the steps of making solder wire, fixing solder wire, etc. are not needed any more, therefore not only the preparation before testing can be simplified largely, but also reliability of connection is ensured, so as to reduce testing time largely and improve testing efficiency.
Specific implementations of the invention will be further described in detail below in conjunction with the figures and embodiments. The following embodiments are used for illustrating the invention, rather than for limiting the scope of the invention.
An embodiment of the invention provides a testing probe, which includes a base, an elastic extensible element and a probe needle, the probe needle being disposed on the base by the elastic extensible element, and the elastic extensible element being in a stretched state. Specifically, the base has a depression, and the depth of the depression is larger than the height of the elastic extensible element in nature state, and one end of the elastic extensile element is disposed in the depression, and the other end of the elastic extensile element connects with the probe needle, so that make the probe needle contacts the base under effect of tension of the elastic extensile element.
As shown in
The elastic extensile element 3 may be a spring or any other element which is made of elastic material. Since the depth of the depression is larger than the height of the elastic extensile element 3 in a nature state, the probe needle 2 contacts the base 1 under effect of tension of the elastic extensile element 3.
As shown in
As shown in
Besides, for increasing the degree of the needle tip 2c sticking into the silver adhesive coated on the testing area during testing of the liquid crystal screen, and improving reliability of the connection, in case of not testing the liquid crystal screen, the probe needle 2 contacts the base 1 under effect of tension of the elastic extensile element 3, that is the elastic extensile element 3 is in a stretched state. During testing of the liquid crystal screen, the elastic extensile element 3 is further stretched, so as to increase the tension to which the probe needle is subject, and in turn increase the degree of the needle tip 2c sticking into the silver adhesive coated on the testing area.
As shown in
By the testing probe provided by the embodiment of the invention, only coating silver adhesive on the testing area of the liquid crystal screen previously is needed, and the steps of making solder wire, fixing solder wire, etc. are not needed any more. Therefore not only the preparation before testing can be simplified largely, but also reliability of connection is ensured, so as to reduce testing time largely and improve testing efficiency.
Besides, the longitudinal section of the base in the embodiment of the invention is not only of an L-like shape as shown, but also may be other shapes. See
See
For improving the stability of the probe needle during testing the liquid crystal screen, the above testing probe further includes a probe needle carrier for carrying the probe needle. As shown in
For the probe needles in all above embodiments, as shown in
Besides, an embodiment of the invention further provides a testing device, which includes any one of the above testing probes.
The above embodiments are used for illustrating but not limiting the invention. Those skilled in the art can make various changes and modifications without departing from the spirit and scope of the invention. Therefore, all equivalent technical solutions also fall into the scope of the invention, and the patent protection scope of the invention should be defined by the enclosed claims.
Claims
1. A testing probe, which is characterized by including comprising:
- a base,
- an elastic extensible element and a probe needle, the probe needle being disposed on the base through the elastic extensible element, and the elastic extensible element being in a stretched state.
2. The testing probe according to claim 1, wherein the probe needle contacts the base under effect of tension of the elastic extensible element.
3. The testing probe according to claim 2, wherein the base has a depression, and the elastic extensible element is disposed at the depression.
4. The testing probe according to claim 3, wherein the depth of the depression is larger than the height of the elastic extensible element in a nature state.
5. The testing probe according to claim 4, wherein the longitudinal section of the base is of an L-like shape or is concave.
6. The testing probe according to claim 1, wherein including multiple elastic extensile elements.
7. The testing probe according to claim 1, wherein the probe needle is disposed on the base through a first elastic extensile element stretched and a second elastic extensile element compressed.
8. The testing probe according to claim 1, wherein the probe needle includes a needle rod portion and a needle head portion, and the range of the angle between the needle rod portion and the needle head portion is from 90 degree to 160 degree.
9. The testing probe according to claim 1, wherein the needle tip of the probe needle is at the same level with the bottom of the base or below the level.
10. The testing probe according to claim 1, further including a probe needle carrier for carrying the probe needle, and through the probe needle carrier, the probe needle connects with the elastic extensible element and is disposed on the base.
11. A testing device, including the testing probe according to claim 1.
Type: Application
Filed: May 13, 2015
Publication Date: Nov 2, 2017
Patent Grant number: 10281490
Inventors: Xuepeng Wang (Beijing), Zhaowei Wang (Beijing)
Application Number: 14/769,782