Particle measurement device

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Description

FIG. 1 is a perspective view illustrating a mount and a resonance unit assembled into a particle measurement device of the present design;

FIG. 2 is an exploded view of the mount and the resonance unit of a particle measurement device of the present design;

FIG. 3 is a front view illustrating the particle measurement device of the present design;

FIG. 4 is a rear view illustrating the particle measurement device of the present design;

FIG. 5 is a left side view illustrating the particle measurement device of the present design;

FIG. 6 is a right side view illustrating the particle measurement device of the present design;

FIG. 7 is a plan view illustrating the particle measurement device of the present design;

FIG. 8 is a bottom view illustrating the particle measurement device of the present design;

FIG. 9 is a perspective view of a mount included in the particle measurement device;

FIG. 10 is a front view of the mount;

FIG. 11 is a rear view of the mount;

FIG. 12 is a left side view of the mount;

FIG. 13 is a right side view of the mount;

FIG. 14 is a plan view of the mount;

FIG. 15 is a bottom view of the mount;

FIG. 16 is a perspective view of a resonance unit included in the particle measurement device;

FIG. 17 is a front view of the resonance unit;

FIG. 18 is a rear view of the resonance unit;

FIG. 19 is a left side view of the resonance unit;

FIG. 20 is a right side view of the resonance unit;

FIG. 21 is a plan view of the resonance unit; and,

FIG. 22 is a bottom view of the resonance unit.

Claims

The ornamental design for a particle measurement device, as shown and described herein.

Referenced Cited
U.S. Patent Documents
5135306 August 4, 1992 Kanebako
6465802 October 15, 2002 Matsuda
7938031 May 10, 2011 Kondo
8603772 December 10, 2013 Debreczeny
Patent History
Patent number: D1054882
Type: Grant
Filed: Apr 13, 2022
Date of Patent: Dec 24, 2024
Assignee: DONGWOO FINE-CHEM CO., LTD. (Jeollabuk-Do)
Inventors: Young-Hoon Kim (Gyeonggi-do), Su-Yeon Oh (Gyeonggi-do), Min Ju Lee (Gyeonggi-do), Seung Pil Han (Jeollabuk-do)
Primary Examiner: Antoine Duval Davis
Application Number: 29/834,611
Classifications
Current U.S. Class: Weight, Force Or Density (D10/83)