Electrical test device
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The broken lines in the figures represent features of the electrical test device that form no part of the claimed design.
Claims
The ornamental design for an electrical test device as shown and described.
D351562 | October 18, 1994 | Moffatt |
D383988 | September 23, 1997 | Luebke |
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D739278 | September 22, 2015 | Payne |
10559173 | February 11, 2020 | Hickman |
D947694 | April 5, 2022 | Moutzouris |
Type: Grant
Filed: May 2, 2023
Date of Patent: Mar 4, 2025
Assignee: Fluke Corporation (Everett, WA)
Inventor: Ginger M. Woo (Shoreline, WA)
Primary Examiner: Antoine Duval Davis
Application Number: 29/875,281