Probe head for a metrology instrument
Description
1. Probe head for a metrology instrument
Articulating support for metrology instrument; the broken line showing is for the purpose of illustrating portions of the article and forms no part of the claimed design.
Claims
The ornamental design for a probe head for a metrology instrument as shown and described.
Referenced Cited
U.S. Patent Documents
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D479544 | September 9, 2003 | Raab |
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9494403 | November 15, 2016 | Rouge et al. |
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Patent History
Patent number: D1082571
Type: Grant
Filed: Mar 31, 2023
Date of Patent: Jul 8, 2025
Assignee: HEXAGON MANUFACTURING INTELLIGENCE SARL (Renens)
Inventors: Matthias Wieser (Wendlingen), Léonard Wunderlin (Tolochenaz), Claude Rouge (Baulmes)
Primary Examiner: Antoine Duval Davis
Application Number: 35/520,462
Type: Grant
Filed: Mar 31, 2023
Date of Patent: Jul 8, 2025
Assignee: HEXAGON MANUFACTURING INTELLIGENCE SARL (Renens)
Inventors: Matthias Wieser (Wendlingen), Léonard Wunderlin (Tolochenaz), Claude Rouge (Baulmes)
Primary Examiner: Antoine Duval Davis
Application Number: 35/520,462
Classifications
Current U.S. Class:
Drafting Machine (D10/63)