Probe head for a metrology instrument

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Description

1. Probe head for a metrology instrument

1.1 : Front

1.2 : Back

1.3 : Top

1.4 : Bottom

1.5 : Right

1.6 : Left

1.7 : Perspective

1.8 : Perspective

Articulating support for metrology instrument; the broken line showing is for the purpose of illustrating portions of the article and forms no part of the claimed design.

Claims

The ornamental design for a probe head for a metrology instrument as shown and described.

Referenced Cited
U.S. Patent Documents
D472170 March 25, 2003 Reymond
D472824 April 8, 2003 Raab
D479544 September 9, 2003 Raab
7213344 May 8, 2007 Jordil et al.
7213345 May 8, 2007 Jordil et al.
7263780 September 4, 2007 Jordil et al.
7282017 October 16, 2007 Jordil et al.
7415775 August 26, 2008 Jordil et al.
D599226 September 1, 2009 Gerent
D610926 March 2, 2010 Gerent
D659035 May 8, 2012 Ferrari
D687322 August 6, 2013 Ferrari
D691498 October 15, 2013 Bailey
9494403 November 15, 2016 Rouge et al.
9759540 September 12, 2017 Ferrari
10302407 May 28, 2019 Chardonnens et al.
10605581 March 31, 2020 Antreasyan et al.
Patent History
Patent number: D1082571
Type: Grant
Filed: Mar 31, 2023
Date of Patent: Jul 8, 2025
Assignee: HEXAGON MANUFACTURING INTELLIGENCE SARL (Renens)
Inventors: Matthias Wieser (Wendlingen), Léonard Wunderlin (Tolochenaz), Claude Rouge (Baulmes)
Primary Examiner: Antoine Duval Davis
Application Number: 35/520,462
Classifications
Current U.S. Class: Drafting Machine (D10/63)