EPR instrument
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Description
The broken lines depict portions of the EPR instrument that form no part of the claimed design.
Claims
The ornamental design for an EPR instrument, as shown and described.
Referenced Cited
U.S. Patent Documents
Foreign Patent Documents
Other references
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- X-Band CW-EPR Spectrometer, posted date unavailable [retrieved online Feb. 12, 2025]. Retrieved from internet, https://www.ciqtekglobal.com/x-band-cw-epr-spectrometer-epr200-plus_p8.html (Year: 2025).
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- High Q Technologies provides routine automated measurements with its Fathom EPR Spectrometer, posted Jan. 8, 2025 [retrieved online Feb. 12, 2025]. Retrieved from internet, https://www.manufacturing-quality.com/quality-news/high-q-automated-measurements-fathom-spectrometer/ (Year: 2025).
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Patent History
Patent number: D1094761
Type: Grant
Filed: Mar 24, 2023
Date of Patent: Sep 23, 2025
Assignee: Quantum Valley Investment Fund LP (Waterloo)
Inventors: Derek Blair Poirier Thompson (Waterloo), Donald Edward Carkner (Waterloo), Wendy A. Hinchey (Waterloo), Andrew Donald Wiles (Waterloo), Rudra Madhava Maharajh (Waterloo)
Primary Examiner: Justin M Jonaitis
Assistant Examiner: Samantha K Pollack
Application Number: 29/873,095
Type: Grant
Filed: Mar 24, 2023
Date of Patent: Sep 23, 2025
Assignee: Quantum Valley Investment Fund LP (Waterloo)
Inventors: Derek Blair Poirier Thompson (Waterloo), Donald Edward Carkner (Waterloo), Wendy A. Hinchey (Waterloo), Andrew Donald Wiles (Waterloo), Rudra Madhava Maharajh (Waterloo)
Primary Examiner: Justin M Jonaitis
Assistant Examiner: Samantha K Pollack
Application Number: 29/873,095
Classifications
Current U.S. Class:
Specimen Handling, Preparation Or Testing (62) (D24/216)