Analyzer device

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Description

FIG. 1 is a first isometric view of an embodiment of an analyzer device, showing our new design;

FIG. 2 is a second isometric view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a first side elevational view thereof;

FIG. 6 is a second side elevational view thereof;

FIG. 7 is a first end elevational view thereof; and,

FIG. 8 is a second end elevational view thereof.

Claims

The ornamental design for an analyzer device, as shown and described.

Referenced Cited
U.S. Patent Documents
5646735 July 8, 1997 Krzyminski
6975395 December 13, 2005 Gentieu
D545438 June 26, 2007 Huang
D569001 May 13, 2008 Omaki
D684490 June 18, 2013 Nelson
D689491 September 10, 2013 Halsinger
9341603 May 17, 2016 Jenkins
20020159050 October 31, 2002 Sharma
20060240401 October 26, 2006 Clarke
20110043494 February 24, 2011 Ko
20110077482 March 31, 2011 Hsieh
20150201876 July 23, 2015 Zhou
20210318248 October 14, 2021 Zenil
Patent History
Patent number: D1103799
Type: Grant
Filed: Apr 2, 2024
Date of Patent: Dec 2, 2025
Assignee: RIGAKU AMERICAS HOLDING, INC. (Wilmington, MA)
Inventors: Michael Damento (Tucson, AZ), Kenneth Vachon (Holliston, MA)
Primary Examiner: Antoine Duval Davis
Application Number: 29/935,544