Probe

Skip to: Description  ·  Claims  ·  References Cited  · Patent History  ·  Patent History
Description

FIG. 1 is a perspective view of a first embodiment of a probe;

FIG. 2 is a front view thereof;

FIG. 3 is a rear view thereof;

FIG. 4 is a left view thereof;

FIG. 5 is a right view thereof;

FIG. 6 is a top view thereof;

FIG. 7 is a bottom view thereof;

FIG. 8 is an enlarged detail view of area A in FIG. 1 thereof;

FIG. 9 is an enlarged detail view of area B in FIG. 1 thereof;

FIG. 10 is an enlarged detail view of area C in FIG. 1 thereof;

FIG. 11 is an enlarged detail view of area D in FIG. 1 thereof;

FIG. 12 is an enlarged detail view of area E in FIG. 2 thereof;

FIG. 13 is an enlarged detail view of area F in FIG. 2 thereof;

FIG. 14 is an enlarged detail view of area G in FIG. 2 thereof;

FIG. 15 is an enlarged detail view of area H in FIG. 2 thereof;

FIG. 16 is a perspective view of a second embodiment of a probe;

FIG. 17 is a front view thereof;

FIG. 18 is a rear view thereof;

FIG. 19 is a left view thereof;

FIG. 20 is a right view thereof;

FIG. 21 is a top view thereof;

FIG. 22 is a bottom view thereof;

FIG. 23 is an enlarged detail view of area I in FIG. 16 thereof;

FIG. 24 is an enlarged detail view of area J in FIG. 16 thereof;

FIG. 25 is an enlarged detail view of area K in FIG. 16 thereof;

FIG. 26 is an enlarged detail view of area L in FIG. 16 thereof;

FIG. 27 is an enlarged detail view of area M in FIG. 17 thereof;

FIG. 28 is an enlarged detail view of area N in FIG. 17 thereof;

FIG. 29 is an enlarged detail view of area O in FIG. 17 thereof; and,

FIG. 30 is an enlarged detail view of area P in FIG. 17 thereof.

The broken lines in the drawings illustrate the portions of the probe, which form no part of the claimed design.

The dot dash lines in the drawings represent a boundary of the claimed design and form no part of the claimed design.

The two-dot dash lines encircling the enlarged views are for annotative purposes only and form no part of the claimed design.

Claims

The ornamental design for a probe, as shown and described.

Referenced Cited
U.S. Patent Documents
D882763 April 28, 2020 Lovmar
Other references
  • Japan Patent Office “Office Action for application No. 2024-021275” issued on Apr. 1, 2025, JPO.
  • Japan Patent Office “Office Action for application No. 2024-021274” issued on Apr. 1, 2025, JPO.
Patent History
Patent number: D1126798
Type: Grant
Filed: Oct 11, 2024
Date of Patent: May 19, 2026
Assignee: MESOSCOPE TECHNOLOGY CO., LTD. (Hsinchu City)
Inventor: Hsin-Hau Huang (Hsinchu City)
Primary Examiner: Antoine Duval Davis
Application Number: 29/967,610