Fixture for dimensional measurement artifacts

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Description

This invention was made with Government support under Contract No. DE-NA-0002839 awarded by the United States Department of Energy/National Nuclear Security Administration. The Government has certain rights in the invention.

FIG. 1 is a top, front, and right perspective view of a fixture for dimensional measurement artifacts;

FIG. 2 is a bottom, rear, and left perspective view thereof;

FIG. 3 is a front elevation view thereof;

FIG. 4 is a right elevation view thereof;

FIG. 5 is a rear elevation view thereof;

FIG. 6 is a left elevation view thereof;

FIG. 7 is a top plan view thereof; and,

FIG. 8 is a bottom plan view thereof.

The broken lines in the drawings depict portions of the fixture for dimensional measurement artifacts and form no part of the claimed design.

Claims

The ornamental design for a fixture for dimensional measurement artifacts as shown and described.

Referenced Cited
U.S. Patent Documents
6023850 February 15, 2000 Trapet
20210318110 October 14, 2021 Anderson
Foreign Patent Documents
111692954 September 2020 CN
112797914 May 2021 CN
113532311 October 2021 CN
118960650 November 2024 CN
Other references
  • Phillips Precision, CMM Tower: M6 Thread, Aluminum, Webpage <https://www.mscdirect.com/product/details/94743622>, 3 pages.
  • Horst, John et al., Research Gate, CAD model of test artifact, Webpage <https://www.researchgate.net/figure/CAD-model-of-test-artifact_fig3_228599990>, 4 pages.
  • Wilcoxon Sensing Technologies, 3-axis accelerometer mounting cube, 10-32 tapped holes, Webpage <https://wilcoxon.com/tc1-2/>, 4 pages.
Patent History
Patent number: D1133951
Type: Grant
Filed: Aug 9, 2023
Date of Patent: Jul 14, 2026
Assignee: Honeywell Federal Manufacturing & Technologies, LLC (Kansas City, MO)
Inventor: Kevin William Swallow (Kansas City, MO)
Primary Examiner: Antoine Duval Davis
Application Number: 29/909,676