Base for a measuring instrument

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Description

FIG. 1 is a right side perspective view of a base for a measuring instrument showing my new design;

FIG. 2 is a rear elevation view thereof;

FIG. 3 is left side elevation view thereof; and

FIG. 4 is a bottom plan view thereof.

Referenced Cited
U.S. Patent Documents
D131835 March 1942 Messana
2774146 December 1956 McCoy
2827707 March 1958 Croshier
2926426 March 1960 Lury
3129512 April 1964 Schiller
3251133 May 1966 Turtschan
3994071 November 30, 1976 Schoffel
Patent History
Patent number: D251483
Type: Grant
Filed: Jun 27, 1977
Date of Patent: Apr 3, 1979
Inventor: Kenneth A. Freeman (Yorba Linda, CA)
Primary Examiner: Nelson C. Holtje
Attorney: Philip M. Hinderstein
Application Number: 5/810,631
Classifications
Current U.S. Class: Element Or Attachment (4) (D10/74); Linear Or Distance (9) (D10/70)
International Classification: D1007;