Reflective height measuring device

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Description

FIG. 1 is a top plan view of a reflective height measuring device showing our new design, the bottom plan being identical;

FIG. 2 is a front elevational view thereof, the rear being plain and unornamented;

FIG. 3 is a typical side elevational view thereof.

The back view of the reflective height measuring device is plain.

Referenced Cited
U.S. Patent Documents
D135418 April 1943 Turner
D169226 March 1953 Sandberg
865709 September 1907 Johnson
Patent History
Patent number: D257962
Type: Grant
Filed: May 14, 1979
Date of Patent: Jan 20, 1981
Inventors: Myrna Youdelman (Hartsdale, NY), Seymour Bain (Hartsdale, NY), Roslyn Bain (Hartsdale, NY)
Primary Examiner: Nelson C. Holtje
Law Firm: Gottlieb, Rackman & Reisman
Application Number: 6/38,900
Classifications
Current U.S. Class: Rule, Tape Or Scale (10) (D10/71)
International Classification: D1004;