Microscope

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Description

FIG. 1 is a side elevational view of a microscope showing my new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is an elevational view of the side opposite that shown in FIG. 1;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof.

Referenced Cited
U.S. Patent Documents
D148123 December 1947 Armbruster et al.
D205729 September 1966 Hoogesteger et al.
3166628 January 1965 Walter
3360641 December 1967 Korte
Other references
  • Booklet, The "Nachet 300" Microscope, published by Hacker Instruments, Inc., Caldwell, N.J. 07006. Bausch & Lomb Optical Co., Booklet, "Optical Instruments in the Textile Industries .COPYRGT.1931," pp. 28, 44, 45. Bausch & Lomb Dynoptic Med. Microscopes Booklet, p. 5. La Pine Science Catalog 1981-1982, .COPYRGT.1981, p. 22.
Patent History
Patent number: D273685
Type: Grant
Filed: Jul 6, 1981
Date of Patent: May 1, 1984
Inventor: Toshikatsu Yamada (Tokyo)
Primary Examiner: Wallace R. Burke
Assistant Examiner: Horace B. Fay
Application Number: 6/280,666
Classifications
Current U.S. Class: Microscope (D16/131)