Automatic semiconductor wafer tester

- Prometrix Corporation
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Description

FIG. 1 is a top and left front perspective view of an automatic semiconductor wafer tester showing my new design;

FIG. 2 is a top plan view thereof;

FIG. 3 is a front elevational view thereof;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a left side elevational view thereof;

FIG. 6 is a right side elevational view thereof.

Referenced Cited
U.S. Patent Documents
D173618 December 1954 Hose
D215120 September 1969 Estes
D276315 November 13, 1984 Collister
D282724 February 25, 1986 Collister
D283107 March 25, 1986 Collister
4348636 September 7, 1982 Doundoulakis
4520931 June 4, 1985 Evain
Patent History
Patent number: D292979
Type: Grant
Filed: Apr 26, 1985
Date of Patent: Dec 1, 1987
Assignee: Prometrix Corporation (Santa Clara, CA)
Inventor: Marland Chow (San Jose, CA)
Primary Examiner: Nelson C. Holtje
Law Firm: Flehr, Hohbach, Test, Albritton & Herbert
Application Number: 6/727,417