Holder for testing an integrated circuit chip

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Description

FIG. 1 is a top, front, and right side perspective view of a holder for testing an integrated circuit chip showing my new design;

FIG. 2 is a bottom, rear, and left side perspective view thereof;

FIG. 3 is a left side elevational view thereof, the right side being a mirror image thereof;

FIG. 4 is a rear elevational view thereof; and

FIG. 5 is a front elevatioal view thereof.

Referenced Cited
U.S. Patent Documents
D249937 October 17, 1978 Jacobson et al.
3648167 March 1972 Purdy et al.
4677375 June 30, 1987 Nakaie et al.
4707656 November 17, 1987 Marzan
Patent History
Patent number: D298923
Type: Grant
Filed: Feb 4, 1986
Date of Patent: Dec 13, 1988
Assignee: Vanguard Electronics Company, Inc. (Gardena, CA)
Inventor: Yoshinobu Sakihara (Los Angeles, CA)
Primary Examiner: B. J. Bullock
Assistant Examiner: Ruth Takemoto
Law Firm: Freilich, Hornbaker, Rosen & Fernandez
Application Number: 6/825,804
Classifications
Current U.S. Class: Element Or Attachment (4) (D10/80)