Probe for electronic thermometer
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Description
FIG. 1 is a front perspective view of a probe for electronic thermometer showing our new design;
FIG. 2 is a rear elevational view thereof;
FIG. 3 is a top plan view thereof; and
FIG. 4 is a bottom plan view thereof.
The broken-line showing of a cable in FIGS. 1 and 2 is environmental only and forms no part of the claimed design.
Referenced Cited
U.S. Patent Documents
D218850 | September 1970 | Sato |
D227801 | July 1973 | Oudewaal |
D233050 | March 1972 | Sato |
D236814 | September 1975 | Sato |
D257239 | October 7, 1980 | Johnson |
D257429 | October 21, 1980 | Manno |
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3738479 | June 1973 | Sato |
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3999434 | December 28, 1976 | Yen |
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Patent History
Patent number: D300909
Type: Grant
Filed: Sep 19, 1986
Date of Patent: May 2, 1989
Assignee: Ivac Corporation (San Diego, CA)
Inventors: Bruce Thornburg (San Diego, CA), Karl B. Baum (Escondido, CA)
Primary Examiner: Nelson C. Holtje
Law Firm: Fulwider, Patton, Rieber, Lee & Utecht
Application Number: 6/909,494
Type: Grant
Filed: Sep 19, 1986
Date of Patent: May 2, 1989
Assignee: Ivac Corporation (San Diego, CA)
Inventors: Bruce Thornburg (San Diego, CA), Karl B. Baum (Escondido, CA)
Primary Examiner: Nelson C. Holtje
Law Firm: Fulwider, Patton, Rieber, Lee & Utecht
Application Number: 6/909,494
Classifications