Measuring instrument

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Description

FIG. 1 is a front elevational view of a measuring instrument showing my new design; the rear being substantially plain and unornamented;

FIG. 2 is a right side elevational view thereof, the left side being a mirror image thereof;

FIG. 3 is a front elevational view of another embodiment of my new design of FIGS. 1 and 2, the rear being substantially plain and unornamented;

FIG. 4 is a right side elevational view thereof, the left side being a mirror image thereof.

Referenced Cited
U.S. Patent Documents
D277462 February 5, 1985 Jacobsen
2110757 March 1938 Clarke
2493912 January 1950 Brown
4217655 August 12, 1980 Chapman
4253239 March 3, 1981 Houck
Patent History
Patent number: D308174
Type: Grant
Filed: Oct 9, 1985
Date of Patent: May 29, 1990
Inventor: Cornelis E. Rijlaarsdam (Alphen aan den Rijn)
Primary Examiner: Nelson C. Holtje
Attorney: John J. Byrne
Application Number: 6/785,826
Classifications
Current U.S. Class: Linear Or Distance (9) (D10/70)