Electronic test probe
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Description
FIG. 1 is a front perspective view of a electronic test probe showing my new design;
FIG. 2 is a rear elevational view, taken along line 2--2 of FIG. 1; and
FIG. 3 is a front end elevational view thereof, taken along line 3--3 of FIG. 3.
Referenced Cited
Patent History
Patent number: D311346
Type: Grant
Filed: Sep 25, 1987
Date of Patent: Oct 16, 1990
Assignee: Q.A. Technology Company (Exeter, NH)
Inventor: Robert F. Gross (Andover, MA)
Primary Examiner: Bruce W. Dunkins
Assistant Examiner: Antoine D. Davis
Law Firm: Davis, Bujold & Streck
Application Number: 7/101,169
Type: Grant
Filed: Sep 25, 1987
Date of Patent: Oct 16, 1990
Assignee: Q.A. Technology Company (Exeter, NH)
Inventor: Robert F. Gross (Andover, MA)
Primary Examiner: Bruce W. Dunkins
Assistant Examiner: Antoine D. Davis
Law Firm: Davis, Bujold & Streck
Application Number: 7/101,169
Classifications
Current U.S. Class:
Element Or Attachment (4) (D10/80)