Electronic test probe

- Q.A. Technology Company
Description

FIG. 1 is a front perspective view of a electronic test probe showing my new design;

FIG. 2 is a rear elevational view, taken along line 2--2 of FIG. 1; and

FIG. 3 is a front end elevational view thereof, taken along line 3--3 of FIG. 3.

Referenced Cited
U.S. Patent Documents
4397519 August 9, 1983 Cooney
4461993 July 24, 1984 Glau
4597622 July 1, 1986 Coe
4659987 April 21, 1987 Coe et al.
Foreign Patent Documents
3103077 August 1982 DEX
Patent History
Patent number: D311346
Type: Grant
Filed: Sep 25, 1987
Date of Patent: Oct 16, 1990
Assignee: Q.A. Technology Company (Exeter, NH)
Inventor: Robert F. Gross (Andover, MA)
Primary Examiner: Bruce W. Dunkins
Assistant Examiner: Antoine D. Davis
Law Firm: Davis, Bujold & Streck
Application Number: 7/101,169
Classifications