Instrument for diagonal observation by microscope
Description
FIG. 1 is a front elevational view of an instrument for diagonal observation by microscope showing my new design;
FIG. 2 is a rear elevational view thereof;
FIG. 3 is a top plan view thereof;
FIG. 4 is a bottom plan view thereof;
FIG. 5 is a left side elevational view thereof;
FIG. 6 is a right side elevational view thereof;
FIG. 7 is a sectional view taken along line VII--VII in FIG. 1;
FIG. 8 is a perspective view which illustrates the instrument mounted in association with a microscope, the latter being shown by broken lines for illustrative purposes only and forming no part of the claimed design; and
FIG. 9 is a right side elevational view similar to FIG. 6 illustrating a different operational state.
Referenced Cited
Patent History
Patent number: D311411
Type: Grant
Filed: Apr 28, 1988
Date of Patent: Oct 16, 1990
Inventor: Zensuke Sato (Kawagoe-shi, Saitama-ken)
Primary Examiner: A. Hugo Word
Assistant Examiner: Doris V. Coles
Law Firm: Flynn, Thiel, Boutell & Tanis
Application Number: 7/187,416
Type: Grant
Filed: Apr 28, 1988
Date of Patent: Oct 16, 1990
Inventor: Zensuke Sato (Kawagoe-shi, Saitama-ken)
Primary Examiner: A. Hugo Word
Assistant Examiner: Doris V. Coles
Law Firm: Flynn, Thiel, Boutell & Tanis
Application Number: 7/187,416
Classifications