Instrument for diagonal observation by microscope

Description

FIG. 1 is a front elevational view of an instrument for diagonal observation by microscope showing my new design;

FIG. 2 is a rear elevational view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a left side elevational view thereof;

FIG. 6 is a right side elevational view thereof;

FIG. 7 is a sectional view taken along line VII--VII in FIG. 1;

FIG. 8 is a perspective view which illustrates the instrument mounted in association with a microscope, the latter being shown by broken lines for illustrative purposes only and forming no part of the claimed design; and

FIG. 9 is a right side elevational view similar to FIG. 6 illustrating a different operational state.

Referenced Cited
U.S. Patent Documents
D278915 May 21, 1985 Hoelbl et al.
D294036 February 2, 1988 Yamada
3398631 August 1968 McGivern et al.
3778131 December 1973 Wanesky
Patent History
Patent number: D311411
Type: Grant
Filed: Apr 28, 1988
Date of Patent: Oct 16, 1990
Inventor: Zensuke Sato (Kawagoe-shi, Saitama-ken)
Primary Examiner: A. Hugo Word
Assistant Examiner: Doris V. Coles
Law Firm: Flynn, Thiel, Boutell & Tanis
Application Number: 7/187,416