Circuit tester

- Polytronics, Inc.
Description

FIG. 1 is a bottom plan view of a circuit tester showing my new design;

FIG. 2 is a top plan view;

FIG. 3 is a front elevational view;

FIG. 4 is a rear elevational view;

FIG. 5 is a right side elevational view; and

FIG. 6 is a left side elevational view thereof.

Referenced Cited
U.S. Patent Documents
D224596 August 1972 Winfrey
D300809 April 25, 1989 Schwartz
3967195 June 29, 1976 Averitt et al.
4034284 July 5, 1977 Peplow et al.
4127807 November 28, 1978 Peplow et al.
4280092 July 21, 1981 Wells, Jr. et al.
Patent History
Patent number: D312583
Type: Grant
Filed: Mar 14, 1988
Date of Patent: Dec 4, 1990
Assignee: Polytronics, Inc. (Buffalo, NY)
Inventor: Harold P. Kopp (Williamsville, NY)
Primary Examiner: Nelson C. Holtje
Assistant Examiner: Antoine D. Davis
Attorney: Joseph P. Gastel
Application Number: 7/167,451
Classifications