X-control measuring gauge

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Description

FIG. 1 is a perspective view with all sides being identical of a x-control measuring gauge showing my new design, drawn on a slightly enlarged scale;

FIG. 2 is a elevational view showing one of the four identical side views;

FIG. 3 is a top plan view; and

FIG. 4 is a bottom plan view thereof.

Referenced Cited
U.S. Patent Documents
D238395 January 1976 Miranda et al.
4238963 December 16, 1980 Ries et al.
4838070 June 13, 1989 Bradley
Other references
  • IBM Technical Disclosure Bulletin, Calibration Tool, 5/1967, p. 1733.
Patent History
Patent number: D322582
Type: Grant
Filed: Nov 20, 1989
Date of Patent: Dec 24, 1991
Assignee: Military Standards Corporation (Marina del Rey, CA)
Inventor: Peter M. Friedman (Marina del Rey, CA)
Primary Examiner: Nelson C. Holtje
Assistant Examiner: Antoine D. Davis
Law Firm: Cislo & Thomas
Application Number: 7/437,993
Classifications
Current U.S. Class: Linear Or Distance (9) (D10/70)