Multimeter

- Metex Corporation
Description

FIG. 1 is a perspective view of a multimeter showing my new design;

FIG. 2 is a perspective view thereof, shown in an operational condition;

FIG. 3 is a top plan view;

FIG. 4 is a bottom plan view;

FIG. 5 is a front elevational view;

FIG. 6 is a rear elevational view; and,

FIG. 7 is a right side elevational view thereof, the left side elevational view being a mirror image.

Referenced Cited
U.S. Patent Documents
D262318 December 15, 1981 Koshino
D308832 June 26, 1990 Shields, Jr. et al.
D314715 February 19, 1991 Nelson et al.
D315691 March 26, 1991 Morgan
4238728 December 9, 1980 Wells, Jr. et al.
4259635 March 31, 1981 Triplett
4604569 August 5, 1986 Tedd et al.
5029296 July 2, 1991 Shang-Wen
Foreign Patent Documents
3511601 October 1986 DEX
Patent History
Patent number: D327226
Type: Grant
Filed: Sep 14, 1989
Date of Patent: Jun 23, 1992
Assignee: Metex Corporation (Seoul)
Inventor: Eui M. Kim (Seoul)
Primary Examiner: Donald P. Walsh
Assistant Examiner: Antoine D. Davis
Law Firm: Kenyon & Kenyon
Application Number: 7/407,457
Classifications