Angle measurement instrument

Description

FIG. 1 is a top, front and right side perspective view of a angle measurement instrument showing my new design;

FIG. 2 is a front elevational view;

FIG. 3 is a rear elevational view;

FIG. 4 is a left side elevational view;

FIG. 5 is a right side elevational view;

FIG. 6 is a top plan view; and,

FIG. 7 is bottom plan view thereof.

FIG. 1 has been drawn on an enlarged scale with respect to FIGS. 2-7.

Referenced Cited
U.S. Patent Documents
14973 April 1884 Thompson
80252 July 1868 Ward
D136535 October 1943 Bley
154976 September 1874 York
655004 July 1900 Penfield
729347 May 1903 Hummel
1125388 January 1915 Parrett
3229372 January 1966 Quashnook et al.
4506451 March 26, 1985 Hiltz
4669195 June 2, 1987 Griffin
4731933 March 22, 1988 Cope
4736524 April 12, 1988 King
Foreign Patent Documents
470745 February 1953 ITX
Patent History
Patent number: D332410
Type: Grant
Filed: Mar 7, 1990
Date of Patent: Jan 12, 1993
Inventor: Steve G. Rowell (Pascagoula, MS)
Primary Examiner: Carmen H. Vales-Lado
Assistant Examiner: Antoine D. Davis
Attorney: Terry M. Gernstein
Application Number: 7/489,659