Angle measurement instrument
Description
FIG. 1 is a top, front and right side perspective view of a angle measurement instrument showing my new design;
FIG. 2 is a front elevational view;
FIG. 3 is a rear elevational view;
FIG. 4 is a left side elevational view;
FIG. 5 is a right side elevational view;
FIG. 6 is a top plan view; and,
FIG. 7 is bottom plan view thereof.
FIG. 1 has been drawn on an enlarged scale with respect to FIGS. 2-7.
Referenced Cited
U.S. Patent Documents
Foreign Patent Documents
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80252 | July 1868 | Ward |
D136535 | October 1943 | Bley |
154976 | September 1874 | York |
655004 | July 1900 | Penfield |
729347 | May 1903 | Hummel |
1125388 | January 1915 | Parrett |
3229372 | January 1966 | Quashnook et al. |
4506451 | March 26, 1985 | Hiltz |
4669195 | June 2, 1987 | Griffin |
4731933 | March 22, 1988 | Cope |
4736524 | April 12, 1988 | King |
470745 | February 1953 | ITX |
Patent History
Patent number: D332410
Type: Grant
Filed: Mar 7, 1990
Date of Patent: Jan 12, 1993
Inventor: Steve G. Rowell (Pascagoula, MS)
Primary Examiner: Carmen H. Vales-Lado
Assistant Examiner: Antoine D. Davis
Attorney: Terry M. Gernstein
Application Number: 7/489,659
Type: Grant
Filed: Mar 7, 1990
Date of Patent: Jan 12, 1993
Inventor: Steve G. Rowell (Pascagoula, MS)
Primary Examiner: Carmen H. Vales-Lado
Assistant Examiner: Antoine D. Davis
Attorney: Terry M. Gernstein
Application Number: 7/489,659
Classifications