X-ray marking instrument

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Description

FIG. 1 is a perspective view of an X-ray marking instrument showing my new design;

FIG. 2 is a top plan view thereof;

FIG. 3 is a bottom plan view thereof;

FIG. 4 is a side elevational view thereof, the opposite side elevational view being a mirror image; and,

FIG. 5 is an end elevational view thereof, the opposite end elevational view being a mirror image.

Referenced Cited
U.S. Patent Documents
4127774 November 28, 1978 Gillen
4426723 January 17, 1984 Rouse
4543091 September 24, 1985 Froning et al.
Patent History
Patent number: D334621
Type: Grant
Filed: Dec 21, 1990
Date of Patent: Apr 6, 1993
Inventor: Michael J. Pope (Troy, OH)
Primary Examiner: Stella Reid
Law Firm: Jacox & Meckstroth
Application Number: 7/631,784