Instrument for measuring size

- Schnyder & Cie S.A.
Description

FIG. 1 is a front elevational view of an instrument for measuring size;

FIG. 2 is a left side elevational view thereof the right side being substantially a mirror image thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a top view thereof;

FIG. 5 is a bottom view thereof; and,

FIG. 6 is a perspective view thereof.

Referenced Cited
U.S. Patent Documents
2923064 February 1960 Rudolph
3781998 January 1974 Okazaki
4547970 October 22, 1985 Brewster
4885845 December 12, 1989 Yamamoto et al.
Patent History
Patent number: D338415
Type: Grant
Filed: Apr 24, 1990
Date of Patent: Aug 17, 1993
Assignee: Schnyder & Cie S.A. (Bevilard)
Inventor: Robert Wuest (Courroux)
Primary Examiner: Alan P. Douglas
Assistant Examiner: Antoine D. Davis
Law Firm: McGlew and Tuttle
Application Number: 7/514,335
Classifications
Current U.S. Class: Linear Or Distance (9) (D10/70)