Instrument for measuring size
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Description
FIG. 1 is a front elevational view of an instrument for measuring size;
FIG. 2 is a left side elevational view thereof the right side being substantially a mirror image thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a top view thereof;
FIG. 5 is a bottom view thereof; and,
FIG. 6 is a perspective view thereof.
Referenced Cited
Patent History
Patent number: D338415
Type: Grant
Filed: Apr 24, 1990
Date of Patent: Aug 17, 1993
Assignee: Schnyder & Cie S.A. (Bevilard)
Inventor: Robert Wuest (Courroux)
Primary Examiner: Alan P. Douglas
Assistant Examiner: Antoine D. Davis
Law Firm: McGlew and Tuttle
Application Number: 7/514,335
Type: Grant
Filed: Apr 24, 1990
Date of Patent: Aug 17, 1993
Assignee: Schnyder & Cie S.A. (Bevilard)
Inventor: Robert Wuest (Courroux)
Primary Examiner: Alan P. Douglas
Assistant Examiner: Antoine D. Davis
Law Firm: McGlew and Tuttle
Application Number: 7/514,335
Classifications
Current U.S. Class:
Linear Or Distance (9) (D10/70)