Microscope

Skip to: Description  ·  References Cited  · Patent History  ·  Patent History
Description

FIG. 1 is a perspective view of a microscope embodying my new design;

FIG. 2 is a second perspective view of the microscope of FIG. 1;

FIG. 3 is a right side elevation view thereof;

FIG. 4 is a left side elevation view thereof;

FIG. 5 is a front elevation view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a rear view thereof.

Referenced Cited
U.S. Patent Documents
D263057 February 16, 1982 Janke et al.
D273592 April 24, 1984 Armbruster
D276351 November 13, 1984 Janke et al.
D296904 July 26, 1988 Lukaszewski
D299357 January 10, 1989 Garnich et al.
4299440 November 10, 1981 Hodgson
4509834 April 9, 1985 Hodgson
4624537 November 25, 1986 Hanssen et al.
4695137 September 22, 1987 Jorgens et al.
4824229 April 25, 1989 Narita et al.
5119233 June 2, 1992 Hayashi
Foreign Patent Documents
3318959 December 1983 DEX
Other references
  • Leitz Sci. & Tech. Inf. (Germany) vol. 7, No. 6 (Jun. 1979); p. 174; Leitz Metalloplan Article by E. Hohn. The Fisher Catalog; Copyright Sep. 1990; p. 1062 Reichert-Jung Microstar IV Model 410 Microscope.
Patent History
Patent number: D345749
Type: Grant
Filed: Jun 5, 1992
Date of Patent: Apr 5, 1994
Assignee: Leica Mikroskopie und Systeme GmbH (Wetzlar)
Inventor: Ernest Hofmann-Igl (Davos-Platz)
Primary Examiner: A. Hugo Word
Assistant Examiner: Cathy Anne MacCormac
Law Firm: Evenson, McKeown, Edwards & Lenahan
Application Number: 7/893,100
Classifications
Current U.S. Class: Microscope (D16/131)