Hardness testing apparatus

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Description

FIG. 1 is a frontal elevational view showing the new design of the present invention;

FIG. 2 is a top plan view showing the new design of the present invention;

FIG. 3 is a rear elevational view showing the new design of the present invention;

FIG. 4 is a bottom view showing the new design of the present invention;

FIG. 5 is a side view showing the new design of the present invention from the right side relative to the view of FIG. 1; and,

FIG. 6 is a side view showing the new design of the present invention from the left side relative to the view of FIG. 1.

Referenced Cited
U.S. Patent Documents
D283599 April 29, 1986 Biddle, Jr. et al.
3102417 September 1963 Chambers
3757567 September 1973 Worden
4118975 October 10, 1978 Iwasaki
Patent History
Patent number: D356515
Type: Grant
Filed: Apr 26, 1993
Date of Patent: Mar 21, 1995
Assignee: Matsuzawa Seiki Kabushikikaisha (Tokyo)
Inventors: Mitoshi Fukumoto (Tokyo), Tetsuo Murakami (Kawasaki)
Primary Examiner: Alan P. Douglas
Assistant Examiner: Antoine D. Davis
Law Firm: Sixbey, Friedman, Leedom & Ferguson
Application Number: 0/7,935
Classifications
Current U.S. Class: Electrical Property (D10/75)