Sample analysis cuvette
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FIG. 1 is a front view of a first embodiment of a sample analysis cuvette showing our new design, the rear view being essentially identical thereto;
FIG. 2 is a top plan view of the embodiment of FIG. 1;
FIG. 3 is a right side view of the embodiment of FIG. 1, the left side view being essentially identical thereto;
FIG. 4 is a bottom plan view of the embodiment of FIG. 1;
FIG. 5 is an elevated perspective view of the embodiment of FIG. 1;
FIG. 6 is a front view of a second embodiment of a sample analysis cuvette showing our new design, the rear view being essentially identical thereto;
FIG. 7 is a top plan view of the embodiment of FIG. 6;
FIG. 8 is a right side view of the embodiment of FIG. 6, the left side view being essentially identical thereto;
FIG. 9 is a bottom plan view of the embodiment of FIG. 6; and,
FIG. 10 is an elevated perspective view of the embodiment of FIG. 6.
Type: Grant
Filed: Feb 23, 1995
Date of Patent: Jul 1, 1997
Assignee: TOA Medical Electronics Co., Ltd. (Kobe)
Inventors: Tsuyoshi Kurosaki (Kakogawa), Masayuki Nakagawa (Hyogo-ken)
Primary Examiner: Louis S. Zarfas
Assistant Examiner: I. Simmons
Law Firm: Cohen, Pontani, Lieberman, Pavane
Application Number: 0/35,242
International Classification: 2402;