Electrical test probe

- Fluke Corporation
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Description

FIG. 1 is a top, front, and right side perspective view of an electrical test probe showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a right side elevational view thereof;

FIG. 4 is a back elevational view thereof;

FIG. 5 is a top plan view thereof; and,

FIG. 6 a bottom plan view thereof.

The broken line showing is for illustrative purposes only and forms no part of the claimed design.

Referenced Cited
U.S. Patent Documents
D391503 March 3, 1998 Van Dyk
Other references
  • 1994 Fluke Test & Measurement Catalog, Fluke Corporation, 1993 Everett, Washington.
Patent History
Patent number: D409929
Type: Grant
Filed: Nov 6, 1997
Date of Patent: May 18, 1999
Assignee: Fluke Corporation (Everett, WA)
Inventors: Steven W. Fisher (Edmonds, WA), Brian S. Aikins (Everett, WA), Craig P. Chamberlain (Seattle, WA)
Primary Examiner: Antoine Duval Davis
Application Number: 0/78,921
Classifications
Current U.S. Class: Provided With Handle, Or Hand-held (D10/78)
International Classification: 1004;