Electrical probe
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Description
FIG. 1 is a perspective view of a an embodiment of an electrical probe showing my new design;
FIG. 2 is a left side elevation view thereof;
FIG. 3 is a top plan view thereof;
FIG. 4 is a right side elevation view thereof;
FIG. 5 is a bottom plan view thereof;
FIG. 6 is a front elevation view thereof; and,
FIG. 7 is a rear elevation view thereof.
Referenced Cited
U.S. Patent Documents
D349658 | August 16, 1994 | Walsh |
Patent History
Patent number: D409930
Type: Grant
Filed: Dec 1, 1998
Date of Patent: May 18, 1999
Assignee: Fluke Corporation (Everett, WA)
Inventor: Christian Peter Suurmeijer (Amersfoort)
Primary Examiner: Antoine Duval Davis
Attorney: George T. Noe
Application Number: 0/97,192
Type: Grant
Filed: Dec 1, 1998
Date of Patent: May 18, 1999
Assignee: Fluke Corporation (Everett, WA)
Inventor: Christian Peter Suurmeijer (Amersfoort)
Primary Examiner: Antoine Duval Davis
Attorney: George T. Noe
Application Number: 0/97,192
Classifications