Reagent strip analyzer

- Bayer Corporation
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Description

FIG. 1 is a front perspective view of the reagent strip analyzer showing the new design;

FIG. 2 is a top plan view thereof;

FIG. 3 is a front elevational view thereof;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a bottom plan view thereof;

FIG. 6 is a left side elevational view thereof; and,

FIG. 7 is a right side elevational view; and,

FIG. 8 is another perspective of the analyzer shown in FIG. 1.

Referenced Cited
U.S. Patent Documents
D251774 May 8, 1979 Olson et al.
D338419 August 17, 1993 Frenkel et al.
5154889 October 13, 1992 Muraishi
5270006 December 14, 1993 Uchigaki et al.
Patent History
Patent number: D410582
Type: Grant
Filed: Feb 9, 1998
Date of Patent: Jun 8, 1999
Assignee: Bayer Corporation (Elkhart, IN)
Inventors: William E. Bigler (Columbus, IN), H. David Collins (Granger, IN), Ken Martin (Palo Alto, CA), Diego A. Rodriguez (Palo Alto, CA), Elisha Tal (San Francisco, CA)
Primary Examiner: Louis S. Zarfas
Assistant Examiner: Gregory Andoll
Attorney: Roger Norman Coe
Application Number: 0/83,240
Classifications
Current U.S. Class: Combined (D10/31); Combined (D10/31)
International Classification: 2401;