Network test instrument case
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Description
FIG. 1 is a perspective view of a first embodiment of a network test instrument case showing our new design;
FIG. 2 is a front plan view thereof;
FIG. 3 is a right side elevational view thereof;
FIG. 4 is a rear plan view thereof;
FIG. 5 is a top elevational view thereof;
FIG. 6 is a bottom elevational view thereof;
FIG. 7 is a perspective view of a second embodiment of network test instrument case showing our new design;
FIG. 8 is a front plan view thereof;
FIG. 9 is a right side elevational view thereof;
FIG. 10 is a rear plan view thereof;
FIG. 11 is a top elevational view thereof; and,
FIG. 12 is a bottom elevational view thereof.
The broken line showing is for illustrative purposes only and forms no part of the claimed design.
Referenced Cited
U.S. Patent Documents
D314715 | February 19, 1991 | Nelson et al. |
D332227 | January 5, 1993 | Kaneko |
D351112 | October 4, 1994 | Fisher et al. |
D355138 | February 7, 1995 | Hoofnagle et al. |
D389759 | January 27, 1998 | Taylor et al. |
D390139 | February 3, 1998 | Tomlyama et al. |
D393262 | April 7, 1998 | Shimatsu et al. |
D395252 | June 16, 1998 | Nelson et al. |
Patent History
Patent number: D424456
Type: Grant
Filed: Sep 1, 1999
Date of Patent: May 9, 2000
Assignee: Fluke Corporation (Everett, WA)
Inventors: Wayne S. Hoofnagle (Redmond, WA), John K. Ikeda (Seattle, WA)
Primary Examiner: Antoine Duval Davis
Attorney: George T. Noe
Application Number: 0/110,228
Type: Grant
Filed: Sep 1, 1999
Date of Patent: May 9, 2000
Assignee: Fluke Corporation (Everett, WA)
Inventors: Wayne S. Hoofnagle (Redmond, WA), John K. Ikeda (Seattle, WA)
Primary Examiner: Antoine Duval Davis
Attorney: George T. Noe
Application Number: 0/110,228
Classifications